Nature and structure of sub-nanometer defects in metal oxides by complex electron spectro-microscopy

通过复杂电子能谱显微镜研究金属氧化物中亚纳米缺陷的性质和结构

• 批准号: 14350340
• 负责人: MUTO Shunsuke
• 金额: $ 10.69万
• 依托单位: Nagoya University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2004
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-14350340/
• 关键词: transmission electron microscopy; electron energy loss spectroscopy; wavelength-dispersive x-ray analysis; cathodoluminescence; defect clusters; first-principle electronic state calculation; light elements analysis; metal oxides; 透過型電子顕微鏡; 酸素複合欠陥

This project aims to develop a complex electron spectroscope TEM for exploring the electronic structures of solids and to apply it to characterize defect dusters consisting of a few to hundreds atoms in metal oxides and ceramic materials. As results we obtained the following achievements :1.Instrumental development1.1 Development of a new TEM specimen holder for detecting cathodoluminescence1.2 Development of wavelength dispersive x-ray analysis spectrometer with grazing incidence configuraion1.3 Equipment with hollow-cone illumination system in TEM2.Development of new analytsis methods for electron spectroscopy2.1 Advanced analysis of extended energy loss fine structure (Reverse Monte Carlo analysis, time-resolved measurements, introduction of wavelet transformation)2.2 Extraction of medium range order of disordered structures by fluctuation electron microscopy2.3 Theoretical simulations of energy loss near edge structure by first principle quantum chemistry calculations2.4 Development of combined method of nanoindentation and finite element method for measuring mechanical properties of ceramics under irradiation3.Applications3.1 Detection of very small defect clusters and structural analysis of impurity oxygen defect complex3.2 Characterization of gas ion irradiation induced blisters on ceramics surfaces3.3 Analysis of hydrogen in hydrogenated nanostructured graphite3.4 Analysis of electronic structures of promoter ceramic in catalysis for purifying automotive gas emission

本项目旨在开发一种用于探索固体电子结构的复杂电子能谱TEM，并将其应用于金属氧化物和陶瓷材料中由几个到几百个原子组成的缺陷粉尘的表征。结果，我们获得了以下成果：1。仪器研制1.1新型阴极发光检测TEM试样架的研制1.2掠入射型波长色散x射线分析光谱仪的研制1.3 TEM2中空锥照明系统设备。电子能谱分析新方法的发展2.1扩展能量损失精细结构的高级分析(反向蒙特卡罗分析，时间分辨测量，小波变换的介绍)2.2用涨落电子显微镜提取无序结构的中量程有序2.3用第一性原理量子化学计算理论模拟能量损失近边结构2.4纳米压痕法与有限元法相结合的方法在辐照下测量陶瓷力学性能3.应用3.1极小缺陷簇的检测及杂质氧缺陷的结构分析络合物3.2气体离子辐照诱导陶瓷表面起泡的表征3.3氢化纳米结构石墨中氢的分析3.4促进剂陶瓷催化净化汽车尾气的电子结构分析

项目成果

In-situ Observation of Surface Blistering in Silicon by Deuterium and Helium Ion Irradiation

氘和氦离子辐照原位观察硅表面起泡

• 发表时间: 2002
• 期刊: Surface and Coatings Technology 158-159C
• 作者: S.Igarashi;S.Muto;T.Tanabe;J.Aihara;K.Hojou
• 通讯作者: K.Hojou

J.Asamai, S.Muto, T.Tanabe: "Chemical effects of hydrogen on surface damaging process in gas-ion irradiated alumina"Surface and Coatings Technology. Vol.158-159C. 518-521 (2002)

J.Asamai、S.Muto、T.Tanabe：“氢对气体离子辐照氧化铝表面损伤过程的化学影响”表面和涂层技术。

Surface blistering of ion irradiated SiC studied by grazing incidence electron microscopy

• DOI: 10.1016/s0022-3115(02)01271-0
• 发表时间: 2002-12
• 期刊: Journal of Nuclear Materials
• 影响因子: 3.1
• 作者: S. Igarashi;S. Muto;T. Tanabe

Science, Technology and Education of Microscopy : an Overview (ed. by A.Mendez-Vilas)

显微镜科学、技术和教育：概述（A.Mendez-Vilas 编辑）

• 发表时间: 2003
• 作者: S.Muto;S.Igarashi;T.Tanabe
• 通讯作者: T.Tanabe

S.Muto, T.Tanabe: "Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally co-ordinated materials"Journal of Electron Microscopy. 52. 125-132 (2003)

S.Muto，T.Tanabe：“四面体配位材料无序结构的扩展能量损失精细结构的逆蒙特卡罗分析”电子显微镜杂志。