Structure analysis of lattice defects in near bulk specimens combining high-voltage electron microscopy and electron energy loss spectroscopy.

晶体材料断裂物理研究突破的关键是可视化和模拟裂纹尖端等大应力强化区域周围大量晶格缺陷（主要是位错）的结构。结合高压电子显微镜和电子能量损失谱，我们成功地开发了厚度大于5μm的样品中位错结构的三维TEM分析。这一工作有助于发展考虑裂纹与位错相互作用的微观断裂力学。

The key to break though the study on fracture physics in crystalline materials is visualizing and modeling the structures of the large number of lattice defects (mainly dislocations) around the area with large stress intensified such as a crack tip. We succeeded to develop a three-dimensional TEM analysis of dislocation structures in the specimens with the thickness more than 5µm, combining high-voltage electron microscopy and electron energy loss spectroscopy. Tis work contributes to the development of micro-fracture mechanics which take into account the interaction between a crack and dislocations.