Visualization of crack-grain boundary interaction in transparent crystals
透明晶体中裂纹与晶界相互作用的可视化
基本信息
- 批准号:08650770
- 负责人:
- 金额:$ 0.32万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (C)
- 财政年份:1996
- 资助国家:日本
- 起止时间:1996 至 1997
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
Crack propagation behavior and its related phenomena in NaCl transparent bicrystals have been investigated by using photoelastic method and etch-pit technique. Crack extension took place on the {001} cleavage plane, and matny slip bands were formed along the {011} slip plane before and during the crack extension. When the crack tip came closer to the grain boundary, crack extension became slower and the threshold stress intensity factor for crack extension KIC^<**> increased. Etch pits observation indicated that the dislocation density around the crack tip became higher near the boundary. The effect of grain boundary on such behavior of crack extension is discussed from the viewpoint of crack tip shielding due to dislocations.
用光弹法和蚀坑技术研究了NaCl透明双晶中的裂纹扩展行为及其相关现象。裂纹在{001}解理面上扩展,在裂纹扩展前和扩展过程中沿{011}滑移面形成沿着滑移带。当裂纹尖端靠近晶界时,裂纹扩展变得缓慢,裂纹扩展的阈值应力强度因子KIC^<**>增加。腐蚀坑观察表明,裂纹尖端附近的位错密度在边界附近变得更高。从位错对裂纹尖端的屏蔽作用出发,讨论了晶界对裂纹扩展行为的影响。
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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HIGASHIDA Kenji其他文献
HIGASHIDA Kenji的其他文献
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{{ truncateString('HIGASHIDA Kenji', 18)}}的其他基金
Structure analysis of lattice defects in near bulk specimens combining high-voltage electron microscopy and electron energy loss spectroscopy.
结合高压电子显微镜和电子能量损失光谱对近块体样品中的晶格缺陷进行结构分析。
- 批准号:
22246090 - 财政年份:2010
- 资助金额:
$ 0.32万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
3-D analyses for crack tip dislocations by using electron tomography
使用电子断层扫描进行裂纹尖端位错的 3D 分析
- 批准号:
18360305 - 财政年份:2006
- 资助金额:
$ 0.32万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Mesoscopic-scale dynamics of materials fracture and workability of silicon crystals
材料断裂的细观动力学和硅晶体的可加工性
- 批准号:
16360316 - 财政年份:2004
- 资助金额:
$ 0.32万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Microstructure of Crack Tip Plastic Zone and Fracture Toughness In Silicon Crystals
硅晶体裂纹尖端塑性区的微观结构与断裂韧性
- 批准号:
14550656 - 财政年份:2002
- 资助金额:
$ 0.32万 - 项目类别:
Grant-in-Aid for Scientific Research (C)
TEM analysis for meso-scale textures developed in heavily deformed Fe-alloys
严重变形铁合金细观织构的 TEM 分析
- 批准号:
12650662 - 财政年份:2000
- 资助金额:
$ 0.32万 - 项目类别:
Grant-in-Aid for Scientific Research (C)
Development of in-sutu observation system for internal stress fields due to lattice defects using the infrared photoelastic method
利用红外光弹法开发晶格缺陷引起的内应力场原位观测系统
- 批准号:
11555162 - 财政年份:1999
- 资助金额:
$ 0.32万 - 项目类别:
Grant-in-Aid for Scientific Research (B).
Study on the dislocation emission around a crack tip by using high-voltage electron microscopy
裂纹尖端周围位错发射的高压电子显微镜研究
- 批准号:
10650651 - 财政年份:1998
- 资助金额:
$ 0.32万 - 项目类别:
Grant-in-Aid for Scientific Research (C)
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