Atomstic mechanical processing ― direct atomistic observation and measurement of stress ―

发展了一种基于高分辨透射电子显微镜的纳米材料原子尺度变形力学的实验方法。在高分辨透射电子显微镜直接原子成像过程中，可以以260 μs的间隔同时观测到亚纳牛顿尺度力和电导的动态变化。直接测量应变、应力和应变-应力关系来分析单个纳米尺寸结构的机械性能。详细的方法和典型的固体点接触和单原子线的结果进行了分析。我们发现，该方法是分析纳米材料原子尺度力学的唯一方法。

We developed an experimental method for the atomic scale deformation mechanics of nanomaterials based on high-resolution transmission electron microscopy. The dynamics of the sub-nano Newton scale force and conductance can be simultaneously observed at intervals of 260 μs during direct atomic imaging by the high-resolution transmission electron microscopy. The strain, stress and strain-stress relation to analyze the mechanical properties of individual nanometer-sized structures are directly measured. Details of the method and typical results of solid point contacts and single atom wires were analyzed. We found that the method is unique method to analyze the atomic scale mechanics of nanomaterials.