Combined electron microscopy for in-situ direct atomistic observation of surface dynamics

用于表面动力学原位直接原子观察的组合电子显微镜

• 批准号: 14350018
• 负责人: KIZUKA Tokushi
• 金额: $ 4.67万
• 依托单位: University of Tsukuba
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2004
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-14350018/
• 关键词: electron microscopy; scanning tunneling microscopy; atomic force microscopyu; surface; nanomaterials; quantized conductance; point contact; friction; 量子コンダクタンス; バリスティック伝導; ナノテクノロジー; 微細接触; 接点; 材料力学; 微細加工; ナノデバイス; 高分解能透過電子顕微鏡; 走査プローブ顕微鏡; 量

The combined electron microscopy of electron microscopy, scanning tunneling microscopy and atomic force microscopy that we had developed was improved for the application in various types of research fields. In the previous method the operation of samples was performed by a manual operation and the observation temperature was restricted to an ambient temperature. In this study, we cleared the restriction and developed the method in order to apply it in researches in various types of scientific and technological fields. We improved spatial resolution of an atom operation and recording method of the image and spectra of the piezo voltage, electric conductance and force. As a result, students of 4th grade in a bachelor course could operate the combined electron microscopy after the instruction of a few months. We also developed several sample stages and new force measurement system. As examples of the application to advanced materials, silicon nanowires of 2 rim in width and 70 nm in length were synthesized by the method. Carbon nanotubes were also fabricated by this method and their properties were analyzed The examples show a highest potential of functions in this method was completed by this study.

我们开发的电子显微镜、扫描隧道显微镜和原子力显微镜的组合电子显微镜得到了改进，可以应用于各种研究领域。在以前的方法中，样品的操作是通过人工操作进行的，并且观察温度仅限于环境温度。在本研究中，我们清除了限制，发展了该方法，以便将其应用于各类科技领域的研究。改进了原子操作的空间分辨率，改进了压电电压、电导和力的图像和光谱记录方法。因此，本科四年级的学生经过几个月的指导，可以操作组合电子显微镜。我们还开发了几个样台和新的力测量系统。作为在先进材料中的应用实例，用该方法合成了宽2圈、长70 nm的硅纳米线。用该方法制备了碳纳米管，并对其性能进行了分析，结果表明，该方法具有很高的功能潜力。

项目成果

Co-doping effects of Pb and La in (Bi, Pb)_2(Sr, La)_2CuO_y

(Bi, Pb)_2(Sr, La)_2CuO_y中Pb和La的共掺杂效应

• 发表时间: 2004
• 期刊: Physica C 412-414
• 作者: T.Amano;M.Tagami;M.Yokoshima;T.Kizuka;S.Nishizaki;R.Yoshizaki
• 通讯作者: R.Yoshizaki

Direct observation of electron migration and induced stress in Cu nanowires

直接观察铜纳米线中的电子迁移和诱导应力

• 发表时间: 2003
• 期刊: Jpn.J.Appl.Phys. 42
• 作者: Satoru Fujisawa;Tokushi Kizuka
• 通讯作者: Tokushi Kizuka

Tokushi Kizuka et al.: "Mechanical Properties of Nanometer-sized Cu Contacts"Proc.Int.Conf. Solid State Devices and Materials. 600-601 (2003)

Tokushi Kizuka 等人：“纳米尺寸铜触点的机械性能”Proc.Int.Conf。

ナノホール制限成長法によるシリコンナノワイヤー作製

使用纳米孔限制生长方法生产硅纳米线

• 发表时间: 2004
• 期刊: まてりあ 43
• 作者: Y.Takatani;K.Asaka;S.Fujisawa;A.Yabe;T.Kizuka;木塚 徳志;木塚 徳志 他
• 通讯作者: 木塚 徳志 他

Lateral displacement of an AFM tip observed by in-situ TEM/AFM combined microscopy : The effect of the friction in AFM

通过原位 TEM/AFM 组合显微镜观察 AFM 尖端的横向位移：AFM 中摩擦的影响

• 发表时间: 2003
• 期刊: Tribology Lett. 15
• 作者: Satoru Fujisawa;Tokushi Kizuka
• 通讯作者: Tokushi Kizuka