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Study on Laser Trapping Probe for Measuring Fine Machined 3-D Form with High Aspect Ratio

Study on Laser Trapping Probe for Measuring Fine Machined 3-D Form with High Aspect Ratio
用于测量高深宽比精加工 3D 形状的激光捕获探针研究
批准号:
13450057
负责人:
TAKAYA Yasuhiro
金额:
$7.87万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2001
资助国家:
日本
项目状态:
已结题
起止时间:
2001 至 2002

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中文摘要
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英文摘要
We propose a new probing technique for the nano-CMM (Coordinate Measuring Machine) which makes it possible to measure a fine machined 3D form with high aspect ratio. The micro-particle optically trapped at the tip of sharpened optical fiber with the diameter of micrometer order and the length of millimeter order is used as the laser trapping probe.Fundamental studies to establish such a micro-probe technique are carried out based on Finite Difference Time Domain (FDTD) simulations of radiation field at the tip of sharpened optical fiber. Moreover, in order to check basic properties for the micro-probe, the forced vibration technique of a micro-particle is developed.Main results of this study are summarized as follows ;(1) The simulation system based on FDTD method is developed. This system makes it possible to analyse radiation pressure for a small dielectric particle illuminated by the infrared laser light traveling in the optical fiber of which tip is sharpened in the cone shape with … More the tip radius of less than 1 μm.(2) The simulation results make it clear that the force of 0.52 pN/mW is exerted on a silica particle of 5 μm in diameter illuminated by the infrared laser light coming out from the sharpened optical fiber with cone angle of 36 degree. It is possible to sustain a small dielectric particle at the tip of the optical fiber by radiation pressure in air.(3) We propose the new forced vibration technique to investigate fundamental properties as a positional detection probe. The optical system with the modulated Laser Diode (LD) and the Acousto-Optic Deflector (AOD) device is developed. Using the modulated LD laser light, vibration is given to a particle by radiation pressure exerted on it. The AOD device is used for wiggling a particle in lateral direction.(4) We measured a spring constant of the laser trapping probe, which is an important dynamical parameter as a probe for the nano-CMM, using the new forced vibration technique. Resonant frequency of 823 Hz to 870 Hz are obtained from fitting curves for amplitude and phase response with taking account of a spring-damper model. Then the spring constant of 1.4x10^<-5> N/m to 1.6x10^<-5> N/m is determined from the resonant frequency. Less
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西川正俊, 三好隆志, 高谷裕浩, 高橋 哲: "強制振動型レーザトラッピングによる位置検出プローブの応答特性"精密工学会2002年度関西地方定期学術講演会講演論文. 97-98 (2002)
Masatoshi Nishikawa、Takashi Miyoshi、Hirohiro Takatani、Satoshi Takahashi:“使用强制振动激光捕获的位置检测探针的响应特性”日本精密工程学会2002年关西地区定期学术会议的演讲论文97-98(2002)。
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上北将広, 三好隆志, 高谷裕浩, 高橋 哲: "レーザトラッピングによるナノCMMプローブに関する研究(第9報)-輪帯ビームプロファイルの検討"2001年度精密工学会秋季大会学術講演会講演論文集(大阪). 630-630 (2001)
Masahiro Kamikita、Takashi Miyoshi、Hirohiro Takatani、Satoshi Takahashi:“使用激光捕获的纳米 CMM 探针研究(第 9 次报告)- 环形光束轮廓的检查”2001 年日本精密工程学会秋季会议学术会议(大阪)会议记录。 630-630 (2001)
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上北将広, 三好隆志, 高谷裕浩, 高橋 哲: "レーザトラッピングによるナノCMMプローブに関する研究(第10報)-強制振動型プローブの提案-"2002年度精密工学会春季大会学術講演会講演論文集(東京). 719-719 (2002)
Masahiro Kamikita、Takashi Miyoshi、Hirohiro Takatani、Satoshi Takahashi:“使用激光捕获的纳米 CMM 探针研究(第 10 次报告)- 强制振动型探针的提案 -”2002 年精密工程学会春季会议学术演讲论文集(东京)719。 -719 (2002)
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上北将広, 三好隆志, 高谷裕浩, 高橋 哲: "レーザトラッピングによるナノCMMプローブに関する研究(第10報)-強制振動型プローブの提案-"2002年度精密工学界春季大会学術講演界講演論文集. 東京(発表予定). (2002)
Masahiro Kamikita、Takashi Miyoshi、Hirohiro Takatani、Satoshi Takahashi:“利用激光捕获的纳米 CMM 探针研究(第 10 次报告)- 强制振动型探针的提案 -”2002 年精密工程学会春季会议学术演讲论文集(即将发表)。 )(2002)。
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15
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