Equipping a transmission electron microscope with a field emission electron gun.
Equipping a transmission electron microscope with a field emission electron gun.
批准号:
13555006
负责人:
TANJI Takayoshi
金额:
$8.51万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2001
资助国家:
日本
项目状态:
已结题
起止时间:
2001 至 2003
中文摘要
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英文摘要
We investigated to apply carbon nano-tubes (CNT) to field emission electron guns for transmission electron microscopes (TEM). Fundamental tips of SiC are prepared by a precision diamond cutter and CNTs are grown by surface decomposition on the top (000-1) surface. The detail of the process is shown hereafter:1.A rod of SiC single crystal along <0001> orientation having a top surface of 0.5mmx0.5mm is cut out by the precise diamond sow with a blade of a special figure. 2.The strain introduced in the cutting process is removed by chemical etching and chemical washing. 3.Focused Ion Beam (FIB) processing are introduced to make the rod thinner. To avoid damaging the top surface, SiO_2, Al or Won Al was evaporated on the rods. 4.Removed the layer of SiO_2 or Al, the rods were heat-treated in a vacuum of 1Pa at 1700℃ for 6hours. The growth of CNTs was confirmed even on the top surface of 0.2μmx0.3μm. 5.In order to give a high conductivity to the tip, graphite layers were grown on a (1210) surface by a heat-treatment in the vacuum of 1x10^<-2>Pa at 1700℃ for 10hours.Field emission characteristics were measured in a high vacuum chamber less than 1x10^<-7>Pa and emission patterns were observed on a fluorescent screen.
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T.Tanji et al.: "Holographic Observation of Magnetic Fine-Structures in New Magnetic Materials."Microscopy and Microanalysis 2002, Quebec City, Canada. Aug.4-8. 30-31 (2002)
T.Tanji 等人:“新型磁性材料中磁性精细结构的全息观察”。显微镜和微分析,2002 年,加拿大魁北克市。
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M.Hibino et al.: "Phase Contrast Transfer Function of Spherical Aberration Corrected Objective Lens."Proc.15th Int.Cong.on Electron Microscopy, Durban, South Africa, Sept.1-6. Vol.3. 39-40 (2002)
M.Hibino 等人:“球差校正物镜的相衬传递函数”。Proc.15th Int.Cong.on Electron Microscopy,南非德班,9 月 1-6 日。
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K.Yamamoto, T.Hirayama, T.Tanji, M.Hibino: "Effects of Fresnel corrections for Phase-shifting electron holography"Microscopy and Microanalysis. 8(suppl.2). 24-25 (2002)
K.Yamamoto、T.Hirayama、T.Tanji、M.Hibino:“菲涅尔校正对相移电子全息术的影响”显微镜和微分析。
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S.Tanaka et al.: "Transmission Electron Microscopy Study of an AIN Nucleation layer for the Growth of GaN on a 7-Degree Off-Oriented (001) Si Substrate by Metalorganic Vapor Phase Epitaxy."J.Crystal Growth. 260-3/4. 360-365 (2004)
S.Tanaka 等人:“通过金属有机气相外延在 7 度偏向 (001) Si 基板上生长 GaN 的 AIN 成核层的透射电子显微镜研究”。J.Crystal Growth。
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丹司敬義: "磁性グラニュラー膜のローレンツ顕微鏡観察"まてりあ. 41・12. 890-891 (2002)
Takayoshi Tanji:“磁性颗粒薄膜的洛伦兹显微镜观察”材料41・12(2002)。
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共 30 条
In-situ observation of fuel cells' reaction by transmission electron microscopy
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批准号:20246013
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$31.28万
-
财政年份:2008
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负责人:TANJI Takayoshi
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依托单位:
In-situ observation of the inner-potential at hetero-interfaces by electron holography
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批准号:16079207
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项目类别:Grant-in-Aid for Scientific Research on Priority Areas
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资助金额:$30.78万
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财政年份:2004
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负责人:TANJI Takayoshi
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依托单位:
Development of a real time stereo phase microscope
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批准号:14205008
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$34.94万
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财政年份:2002
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负责人:TANJI Takayoshi
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依托单位:
Development of electron differential interferometry and its application to magnetic materials
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批准号:09555021
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$7.17万
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财政年份:1997
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负责人:TANJI Takayoshi
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依托单位:
Fundamental Study on magnetic-granular films with fine structures
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批准号:08455142
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$4.74万
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财政年份:1996
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负责人:TANJI Takayoshi
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依托单位:
海外基金