Development of electron differential interferometry and its application to magnetic materials
Development of electron differential interferometry and its application to magnetic materials
批准号:
09555021
负责人:
TANJI Takayoshi
金额:
$7.17万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1997
资助国家:
日本
项目状态:
已结题
起止时间:
1997 至 1999
中文摘要
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英文摘要
Electron holography, which enables us to measure the electron phase shift with high precise and high resolution, requires a well-defined reference wave. This restricts the application to materials science. The theme of this research is to develop a new electron differential microscopy to overcome this disadvantage of electron holography and a system which makes a real time observation possible.Following results have been obtained in this project :i) In order to compensate for the lack of sensitivity in differential interferometry for weak phase objects, we proposed electron phase differential micrography that is realized by means of digital reconstruction method. For convenience an electron trapezoidal prism has been invented and replaced electron biprism.ii) We successfully observed directly the magnetic vectors in ferromagnetic thin films and that leaking from single magnetic domain particles by the two dimensional differentiation. It has been found that the reference phase reconstructed from all holograms should be coincident to each other, and an effect of Fresnel diffraction at an electron prism is important, too.iii) A complete simulation of electron holograms which include Fresnel effects, the quantum noise and the coherency of electrons has been accomplished.iv) Applying an additional square-wave voltage to the electron trapezoidal prism and recording double-exposure holograms on videotape, we confirmed that the real time observation in electron differential interferometry is available, though the time resolution obtained is about 1 sec. so far.
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T. Hanai: "Characteristics and effectiveness of a foil lens for correction of spherica aberration in scanning transmission electron microscopy"Journal of Electro Microscopy. 47・3. 185-192 (1998)
T. Hanai:“扫描透射电子显微镜中用于校正球面像差的箔透镜的特性和有效性”《电子显微镜杂志》47・3(1998)。
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平山司: "電子波干渉による電場・磁場の直視と材料科学への応用"まてりあ. 37・6. 454-460 (1998)
平山司:“通过电子波干涉直接观察电场和磁场及其在材料科学中的应用”Materia 37・6(1998)。
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T. Hanai: "Reduction of spherical aberration of a transmission electron microscope by means of a foil lens"Electron Microscopy. 1. 82-84 (1998)
T. Hanai:“通过箔透镜减少透射电子显微镜的球差”电子显微镜。
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K. Yamamoto: "Hologram simulation for off-axis electron holography"Ultramicroscopy. in press.
K. Yamamoto:“离轴电子全息术的全息图模拟”超显微镜。
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T.Hanai: "Maximum entropy restoration of electron microscope images with random spatial distribution constraint" Scanning Microscopy. supl.11(発表予定). (1998)
T.Hanai:“具有随机空间分布约束的电子显微镜图像的最大熵恢复”扫描显微镜。11(待提交)。
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共 42 条
In-situ observation of fuel cells' reaction by transmission electron microscopy
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批准号:20246013
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$31.28万
-
财政年份:2008
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负责人:TANJI Takayoshi
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依托单位:
In-situ observation of the inner-potential at hetero-interfaces by electron holography
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批准号:16079207
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项目类别:Grant-in-Aid for Scientific Research on Priority Areas
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资助金额:$30.78万
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财政年份:2004
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负责人:TANJI Takayoshi
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依托单位:
Development of a real time stereo phase microscope
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批准号:14205008
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$34.94万
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财政年份:2002
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负责人:TANJI Takayoshi
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依托单位:
Equipping a transmission electron microscope with a field emission electron gun.
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批准号:13555006
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$8.51万
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财政年份:2001
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负责人:TANJI Takayoshi
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依托单位:
Fundamental Study on magnetic-granular films with fine structures
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批准号:08455142
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$4.74万
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财政年份:1996
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负责人:TANJI Takayoshi
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依托单位:
海外基金