Scanning probe microscope

点击翻译按钮获取中文摘要

In this document a scanning probe microscope for the correlative analysis of solid state materials is requested. The microscope is intended to be used for the analysis and optimization of growth processes and processing techniques for solids, particularly semiconductors and their quantum and nanostructures as well as low dimensional semiconductors. For space-resolved analysis of the correlation between structural and electronic properties, nanomechanical and nanoelectronic characterization tools such as scanning capacitance microscopy or Kelvin probe force Microscopy are required. Moreover, the formation of lateral nanostructures in ultrathin layers by local anodic oxidation should be possible. For functional and structural analysis of electrochemical and biochemical sensor structures as well as functionalized surfaces the requested measurement system should contain an electrochemical cell that allows both for analysis of the surface morphology and characterization of electrochemical surface properties in electrolytes. The specific setup of the requested microscope allows the application in a wide range of different research projects and presents a substantial improvement of the experimental infrastructure for the research groups in solid state physics and material science at the University of Bremen.