Scanning probe microscope

在本文中，需要一台用于固态材料相关分析的扫描探针显微镜。该显微镜旨在用于分析和优化固体，特别是半导体及其量子和纳米结构以及低维半导体的生长过程和加工技术。为了对结构和电子性质之间的相关性进行空间分辨分析，需要使用扫描电容显微镜或开尔文探针力显微镜等纳米机械和纳米电子表征工具。此外，通过局部阳极氧化在超薄层中形成横向纳米结构应该是可能的。对于电化学和生化传感器结构以及功能化表面的功能和结构分析，所要求的测量系统应包含一个电化学池，该电化学池既可用于分析表面形态，又可用于表征电解液中的电化学表面性质。所要求的显微镜的具体设置允许在广泛的不同研究项目中应用，并为不来梅大学固体物理和材料科学研究小组的实验基础设施提供了实质性的改进。

In this document a scanning probe microscope for the correlative analysis of solid state materials is requested. The microscope is intended to be used for the analysis and optimization of growth processes and processing techniques for solids, particularly semiconductors and their quantum and nanostructures as well as low dimensional semiconductors. For space-resolved analysis of the correlation between structural and electronic properties, nanomechanical and nanoelectronic characterization tools such as scanning capacitance microscopy or Kelvin probe force Microscopy are required. Moreover, the formation of lateral nanostructures in ultrathin layers by local anodic oxidation should be possible. For functional and structural analysis of electrochemical and biochemical sensor structures as well as functionalized surfaces the requested measurement system should contain an electrochemical cell that allows both for analysis of the surface morphology and characterization of electrochemical surface properties in electrolytes. The specific setup of the requested microscope allows the application in a wide range of different research projects and presents a substantial improvement of the experimental infrastructure for the research groups in solid state physics and material science at the University of Bremen.