Development of a high-resolution beam profile monitor using zone plates

使用波带片开发高分辨率光束轮廓监视器

• 批准号: 16540234
• 负责人: NAKAMURA Norio
• 金额: $ 2.5万
• 依托单位: The University of Tokyo
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2004
• 资助国家: 日本
• 起止时间: 2004 至 2005
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-16540234/
• 关键词: Zone plate; Beam profile; Beam size; Accelerator; High-brilliance light source; Beam monitor; Synchrotron Radiation; X-ray imaging optics

By this project, performance and reliability of this beam profile monitor was greatly improved and this monitor became fully practical. The research results are summarized below.1. Background due to transmitted X-rays through the zone plates was much reduced by an X-ray pinhole mask installed around the focus point of the first zone plate.2. Vibrations of the zone plates were measured by seismometers and their effect on spatial resolution of the monitor was evaluated. As a result, the vibration effect was negligibly small even by taking magnification of the imaging system into account and the configuration of the zone plates insensitive to vibrations was studied.3. An estimation method of spatial resolution of the monitor and the effects of the zone-plate alignment errors on the resolution was established by using a developed computer code based on wave optics. By this code, the tolerable ranges of the alignment errors were also obtained. Analysis using a developed ray-tracing code was successfully performed.4. A system for synchronization with injection was added to this monitor. As a result, we succeeded in obtaining the damping time of the KEK-ATF damping ring with the damping wiggler on and off by measuring the beam size as function of the time after injection. The synchronization system enabled us to do various beam diagnoses related to injection.5. Time resolution of the monitor was greatly improved by installing the fast mechanical shutter around the focusing point of the first zone plate. As a result, the effect of the fast position movement of the beam image on the beam size measurement was removed.6. Remote control of the monitor system from the accelerator control room was realized. Thus measurements of beam profiles and sizes can be linked with control of the accelerator and easily be done at any time during the accelerator operation.

通过该方案的实施，大大提高了束流剖面监测仪的性能和可靠性，使束流剖面监测仪完全实用化。研究结果总结如下：1.通过在第一波带片的焦点周围安装X射线针孔掩模，大大减少了透射X射线通过波带片的背景。波带片的振动测量地震仪和监测器的空间分辨率的影响进行了评估。结果表明，即使考虑成像系统的放大倍数，振动的影响也很小，可以忽略不计，并研究了波带片对振动不敏感的结构.基于波动光学原理，利用已开发的计算机程序，建立了一种测量波带片空间分辨率的方法，并分析了波带片安装误差对空间分辨率的影响。利用该程序还得到了对准误差的容许范围。利用开发的射线追踪程序进行了分析.该监测仪增加了一个与注射同步的系统。结果，我们成功地获得了KEK-ATF阻尼环的阻尼时间与阻尼摇摆器的打开和关闭通过测量作为注入后的时间的函数的光束尺寸。同步系统使我们能够进行各种与注入相关的光束诊断。通过在第一波带片的聚焦点附近安装快速机械快门，大大提高了监视器的时间分辨率。消除了束流图像位置快速移动对束流尺寸测量的影响.实现了从加速器控制室对监控系统的远程控制。因此，束轮廓和尺寸的测量可以与加速器的控制相关联，并且可以在加速器操作期间的任何时间容易地进行。

项目成果

Performance Evaluation of a Beam Profile Monitor using Fresnel Zone Plates

使用菲涅尔波带板的光束轮廓监测器的性能评估

• 发表时间: 2005
• 期刊: Proceedings of the 2^<nd> Annual Meeting of Particle Accelerator Society of Japan and the 29^<th> Linear Accelerator Meeting in Japan
• 作者: Yasutake;N.;S.Aoki;T.Ishikawa et al.;T.Ishikawa;T.Ishikawa;T.Ishikawa et al.;T.Ishikawa et al.;T.Ishikawa;Hiroshi Sakai;Hiroshi Sakai;Toshiya Muto
• 通讯作者: Toshiya Muto

An Electron-Beam Profile Monitor Using Fresnel Zone Plates

使用菲涅尔波带板的电子束轮廓监测器

• 发表时间: 2004
• 期刊: Proceedings of the 8^<th> International Conference on Synchrotron Radiation Instrumentation : AIP Conference Proceedings 705
• 作者: Yasutake;N.;S.Aoki;T.Ishikawa et al.;T.Ishikawa;T.Ishikawa;T.Ishikawa et al.;T.Ishikawa et al.;T.Ishikawa;Hiroshi Sakai;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Hiroshi Sakai;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Norio Nakamura
• 通讯作者: Norio Nakamura

フレネルゾーンプレートを用いた高分解能ビームプロファイルモニタの開発

使用菲涅耳波带片开发高分辨率光束轮廓监视器

• 发表时间: 2004
• 期刊: 日本放射光学会誌「放射光」 17巻4号
• 作者: Yasutake;N.;S.Aoki;T.Ishikawa et al.;T.Ishikawa;T.Ishikawa;T.Ishikawa et al.;T.Ishikawa et al.;T.Ishikawa;Hiroshi Sakai;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Hiroshi Sakai;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Norio Nakamura;Norio Nakamura;中村 典雄
• 通讯作者: 中村 典雄

Measurement of the beam profiles with the improved Fresnel zone plate monitor

使用改进的菲涅耳波带片监视器测量光束轮廓

• 发表时间: 2006
• 期刊: Proceedings of the 10^<th> European Particle Accelerator Conference
• 作者: Yasutake;N.;S.Aoki;T.Ishikawa et al.;T.Ishikawa;T.Ishikawa;T.Ishikawa et al.;T.Ishikawa et al.;T.Ishikawa;Hiroshi Sakai
• 通讯作者: Hiroshi Sakai

Development of a high-resolution beam profile monitor using Fresnel zone plates

使用菲涅尔波带片开发高分辨率光束轮廓监视器

• 发表时间: 2004
• 期刊: Journal of the Japanese Society for Synchrotron Radiation Research Vol.17, No.4
• 作者: Yasutake;N.;S.Aoki;T.Ishikawa et al.;T.Ishikawa;T.Ishikawa;T.Ishikawa et al.;T.Ishikawa et al.;T.Ishikawa;Hiroshi Sakai;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Hiroshi Sakai;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Hiroshi Sakai;Toshiya Muto;Takeshi Naito;Norio Nakamura;Norio Nakamura;中村 典雄;Norio Nakamura
• 通讯作者: Norio Nakamura