Structure analysis on the gas-liquid interface from the view point of solution chemistry

本课题的目的是建立一种新的光谱方法来研究空气-溶液界面上离子的溶剂化结构。本方法是在溶液表面全反射条件下的XAFS技术。由于x射线区全反射条件下溶液表面的接受角很小，因此只能使用同步辐射进行实验。我们成功地研究了溴离子被烷基铵分离到溶液表面后的表面浓度及其溶剂化结构。另一项研究是将偏振相关的XAFS应用于溶液表面形成的平面Zn和cu配合物。通过x - afs的极化，可以确定配合物的优先取向。

The purpose of this project is to develop a new spectroscopic method to study the solvation structures of ions which lie on the air-solution interface. The present method is an XAFS technique operated under the total-reflection condition at the solution surface. Due to a very small acceptance angle onto the solution surface for the total-reflection condition at X-ray region, the experiment can be performed only by using synchrotron radiation. We could successfully study the surface concentration of Br ions and its solvation structures which were segregated to the solution surface by alkylammonium. Another study was a polarization dependent XAFS applied to planar Zn- and Cu-complexes formed at the solution surface. From the polarization XAFS the preferential orientation of the complexes could be determined.