Structure Analysis of Solution Surface by Photoelectron Yield XAFS Method.

通过光电子产额 XAFS 方法分析溶液表面的结构。

• 批准号: 05453057
• 负责人: WATANABE Iwao
• 金额: $ 4.29万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for General Scientific Research (B)
• 财政年份: 1993
• 资助国家: 日本
• 起止时间: 1993 至 1994
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-05453057/
• 关键词: Solution surface; Solvation structure; EXAFS; Bromide ion; Total-reflection XAFS; Surfactant; Photoelectron yield XAFS; 光電子収率XAFS; 電子収率XAFS; 全反射XAFS; ルビジウムイオン

The X-ray absorption fine structure (XAFS) spectroscopy is a powerful tool for the short range structure analyzes of amorphous samples and liquids. In this study its application is extended to the chemical species at air/water interface. The surface active ions and molecules segregated at the solution surface are playing important role in the processes of solvent extraction, phase -transfer, and the formation of the Langmuir-Blodgett film, although almost nothing is known about the solvation structures of the surface species.The monochromatized X-ray beam was introduced into the solution cell at a grazing incidence angle of 1mrad under the total-reflection condition. The cell contains a 66mm x 216mm trough which is cooled to 1? A1C and the cell is filled with helium gas at an atmospheric pressure. The XAFS of the surface species was determined by detecting the conversion electron current or the helium ion current. Stearyltrimethylammonium bromide aqueous solution at 0.1mM concentration gave quite an intense signal for Br K-edge absorption. The spectrum was different from that of bulk solution by the transmission method.

x射线吸收精细结构（XAFS）光谱是分析非晶态样品和液体的短程结构的有力工具。本研究将其应用扩展到空气/水界面的化学物质。在溶液表面分离的表面活性离子和分子在溶剂萃取、相转移和Langmuir-Blodgett膜的形成过程中起着重要的作用，尽管对表面物质的溶剂化结构几乎一无所知。在全反射条件下，以1mrad的掠入射角将单色x射线光束引入溶液池。电池包含一个66mm x 216mm的槽，冷却到1？在大气压下，电池中充满了氦气。通过检测转换电子电流或氦离子电流来测定表面物质的XAFS。0.1mM浓度的硬脂基三甲基溴化铵水溶液对溴的k边吸收信号较强。透射法测得的光谱与本体溶液不同。

项目成果

M.Takahashi: "Electron and Helium lon Yield XAFS of Sputter-Deposited lron Silidcide Thin Films." Physica B. (印刷中). (1995)

M. Takahashi：“溅射沉积铁硅化物薄膜的电子和氦产率 XAFS”。Physica B.（1995 年出版）。

H.Tanida: "Photoelectron Emission Spectroscopy Applied to Anions in Solution." J.Molecular Liquids. (印刷中). (1995)

H.Tanida：“应用于溶液中阴离子的光电子发射光谱”（J.Molecular Liquids）（出版中）。

S.Kohiki, M.Nishitani, T.Negami, T.Wada, H.Monjushiro, I,Watanabe and Y.Yokoyama: "UV Photoelectron Yield Spectroscopy of Chalcopyrite Structure Cu-In-Se Thin Films" Thin Solid Films. 238. 195-198 (1994)

S.Kohiki、M.Nishitani、T.Negami、T.Wada、H.Monjushiro、I、Watanabe 和 Y.Yokoyama：“黄铜矿结构 Cu-In-Se 薄膜的紫外光电子产率光谱”固体薄膜。

T.Miyanaga: "EXAFS Debye-Waller Factor and Ligand Exchange Reaction of Hydrated Metal Complexes." Bull.Chem.Soc.Jpn.(in press).

T.Miyanaga：“EXAFS Debye-Waller 因子和水合金属配合物的配体交换反应。”

H.Tanida, H.Sakane and I.Watanabe: "Solvation Structures for Bromide Ion In Various Solvents by Extended X-Ray Absorption Fine Structure" J.Chem.Soc., Dalton Trans.15. 2321-2326 (1994)

H.Tanida、H.Sakane 和 I.Watanabe：“通过扩展 X 射线吸收精细结构确定各种溶剂中溴离子的溶剂化结构”J.Chem.Soc.，Dalton Trans.15。