Linear On-Wafer Vector-Network-Analysis

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High-frequency measurement technology is essential for a wide range of research tasks in the field of communications and medical technology. The chairs of Communication and High Frequency Engineering and Electronics are involved in both research areas with corresponding projects. The large-scale devices for linear and non-linear characterization of systems, components and materials applied for will enable the chairs to address current research questions in the frequency range from a few MHz to 120 GHz. The systems can be used for the following metrological tasks, among others: (a) linear on-wafer and coaxial measurements up to 120 GHz, (b) non-linear measurements up to 67 GHz and (c) large signal measurements up to 40 GHz. The aim of the present large-scale equipment application is to equip the applicant institution with a measurement facility for research into new systematic approaches, for system evaluation and demonstration as well as for the required material characterization with the highest performance. The participating chairs are to be sustainably equipped for cutting-edge research in the field of novel concepts and technologies for adaptive communication systems and problem-adapted sensor systems based on electro-magnetic functional principles.