Development of non contact piezoelectricity measurement system By Brillouin light scattering

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A non contact and non destructive measurement system of longitudinal wave velocity in GaN crystals was successfully developed by using a Brillouin light scattering technique. This technique enables to measure velocities in the GHz range, where the piezoelectricity in the conductive material is expected to appear. Using this technique, we could obtain the temperature dependence of longitudinal wave velocity in the conductive GaN crystal. In addition, a velocity dispersion was found in the semi conductive GaN crystal, which was similar to the weak relaxation behavior accompanied by the piezoelectric stiffening effect.