STUDY ON DEFECT FORMATION IN BULK CRYSTAL FOR ELECTRONIC DEVICES
STUDY ON DEFECT FORMATION IN BULK CRYSTAL FOR ELECTRONIC DEVICES
批准号:
09650813
负责人:
KAKIMOTO Koichi
金额:
$2.11万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1997
资助国家:
日本
项目状态:
已结题
起止时间:
1997 至 1999
中文摘要
Molecular dynamics simulation was carried out to estimate diffusion constants and mechanism of pointdefects such as a single vacancy and a self-interstitial atom under hydrostatic pressure.Stillinger-Weber potential used as a model potential,这是一个widely accepted for modeling of silicon crystals and melts.我们拥有追随者results on a self-interstitial atom from the calculation. 1) Diffusion constants ofself-interstitial are almost independent of pressure within a range from -50 to + 50k bar. 2self-interstitial atom diffuses with a formation of dumbbell结构which is aligned in [110] direction. For single vacancythe following were clarified. 1) Diffusion constants of vacancy are also independent of pressure2) a vacancy diffuses with a switching mechanism to nearestneighbor lattice site.Molecular dynamic simulation of an oxygen atom in silicon crystal and the melt这也是在oxygen在melt. the simulation using obtain diffusion constants of oxygenmixed potential in the melt in which an oxygen atom and 216 silicon atoms taken into accountVibration frequencies of oxygen and vacancy-oxygen (V-O) pair in the crystalhave been calculated. calculated frequency of oxygen and V-O pair were 1000 and 800 cmrespectively,while experimental results which were obtained from Fourier transform spectra of infrared absorption(FTIR) are 1100 and 830 cm我们D1-1我们D1,Oxygen diffusion constant obtained in elevated temperature of 1700k . Calculateddiffusion constant of oxygen in the melt was 2x10 - 1-4 - D1 cm - D12 - D1/sec。
英文摘要
Molecular dynamics simulation was carried out to estimate diffusion constants and mechanism of point defects such as a single vacancy and a self-interstitial atom under hydrostatic pressure. Stillinger-Weber potential was used as a model potential, which is widely accepted for modeling of silicon crystals and melts. We obtained the following results on a self-interstitial atom from the calculation. 1) Diffusion constants of self-interstitial are almost independent of pressure within a range from -50 to +50 k bar. 2) A self-interstitial atom diffuses with a formation of dumbbell structure, which is aligned in [110] direction. For single vacancy, the following were clarified. 1) Diffusion constants of vacancy are also independent of pressure within a range from -40 to +40 k bar. 2) A vacancy diffuses with a switching mechanism to nearest neighbor lattice site.Molecular dynamic simulation of an oxygen atom in silicon crystal and the melt was also carried out to obtain diffusion constants of oxygen in the melt. The simulation using mixed potential in the melt in which an oxygen atom and 216 silicon atoms were taken into account has been carried out. Vibration frequencies of oxygen and vacancy-oxygen (V-O) pair in the crystal have been calculated. Calculated frequency of oxygen and V-O pair were 1000 and 800 cmィイD1-1ィエD1, respectively, while experimental results which were obtained from Fourier transform spectra of infrared absorption (FTIR) are 1100 and 830 cmィイD1-1ィエD1, respectively. Oxygen diffusion constant was obtained in elevated temperature of 1700 K. Calculated diffusion constant of oxygen in the melt was 2x10ィイD1-4ィエD1 cmィイD12ィエD1/sec.
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K.Kakimoto,T.Umehara and H.Ozoe: "Molecular dynamics analysis of point defects in silicon near solid-liquid interface"Surface Science. (in print). (2000)
K.Kakimoto、T.Umehara 和 H.Ozoe:“固液界面附近硅中点缺陷的分子动力学分析”表面科学。
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通讯作者:
K.Kakimoto and H.Ozoe: "Segregation of Oxygen at a solid/liquid interface in silicon" J.Electrochem.Soc.Vol.145. 1692-1695 (1998)
K.Kakimoto 和 H.Ozoe:“硅中固/液界面处的氧分离”J.Electrochem.Soc.Vol.145。
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K. Kakimoto, S. Kikuchi and H. Ozoe: "Molecular dynamics simulation of oxygen in silicon melt"J. of Crystal Growth. Vol. 198/199, Part 1. 114-119 (1999)
K. Kakimoto、S. Kikuchi 和 H. Ozoe:“硅熔体中氧的分子动力学模拟”J。
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柿本浩一,菊池晋,尾添紘之: "分子動力学法によるシリコン中の酸素の運動解析" 第45回応用物理学関係連合講演会. (発表予定).
Koichi Kakimoto、Susumu Kikuchi、Hiroyuki Ozoe:“利用分子动力学方法对硅中的氧进行运动分析”第 45 届应用物理学会报告会(待发表)。
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K. Kakimoto: "Macroscopic and microscopic mass transfer in silicon Czochralski method"J. of Korean Association of Crystal Growth. 9. 381-383 (1999)
K. Kakimoto:“硅直拉法中的宏观和微观传质”J。
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共 15 条
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依托单位:
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财政年份:2007
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依托单位:
Establishment of new method of crystal growth with well-controlled convection by electro-magnetic force
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批准号:14350010
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财政年份:2002
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负责人:KAKIMOTO Koichi
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依托单位:
海外基金