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Application of Multilayer Reflectors to Spectroscopic and Instruments for Cosmic X-Ray Observation

多层反射镜在光谱仪和宇宙X射线观测仪器中的应用

基本信息

批准号：
60420004
负责人：
YAMASHITA Koujun
金额：
$ 20.03万
依托单位：
Osaka University
依托单位国家：
日本
项目类别：
Grant-in-Aid for General Scientific Research (A)
财政年份：
1985
资助国家：
日本
起止时间：
1985 至 1987
项目状态：
已结题

项目摘要

Development of multilayer reflectors makes it possible to apply to the grazing and normal incidence X-ray optic system for the comsic X-ray observation in 0.1 - 10keV region. For the grazing incidence X-ray telescope, multilayer reflectors have an advantage to make larger the glancing angle and to extend the energy range up to 10keV in the fixed geometrical configuration. The normal incidence X-ray telescope is attainable in the energy range below 0.4keV, though the sensitive energy hand is limited by Bragg condition estimated form the layer thickness and the number of layer pairs. Multilayers are also useful optical elements to fabricate the X-ray spectrometer and polarimeter.We are fabricating multilayer reflectors with an electro beam evaporation in method ultrahigh vacuum. Material combinations are Mo/C, Mo/Si and Ni/C with 5-20 layer pairs and the layer thickness of 36-100A. They are deposited on flat and figured substrates of float glass and superpolished glass with the surface roughness of 2-3A(rms).Multilayers thus fabricated are evaluated by measuring the reflectivity, the wavelength resolution and the Bragg angle of the reflection order with four characteristic X-rays of Cu-K<alpha>(1.54A), Si-K<alpha> (7.13A), Al-K<alpha>(8.34A), C-K<alpha>(44.7A). Further investigations are carried out with the monochromatized synchrotron radiation in 14-250A band at Photon Factory, National Laboratory for High Energy Physics, and at UVSOR, Institute for Molecular Science. The peak reflectivity of Cu-K<alpha> is obtained to be 80% for Mo/C in the grazing incidence and that of <lambda>160A to be more than 30% for Mo/Si in the near normal incidence.

多层反射镜的研制使掠入射和正入射X射线光学系统在0.1 - 10 keV范围内进行comsic X射线观测成为可能。对于掠入射X射线望远镜，多层膜反射镜具有在固定几何结构下增大掠射角和扩展能量范围的优势，最大可达10 keV。正入射X射线望远镜在0.4keV以下的能量范围内是可以实现的，但灵敏能手受到由层厚和层对数估算的布拉格条件的限制。多层膜也是制作X射线光谱仪和旋光仪的有用光学元件。我们用电子束蒸发法在真空中制作多层膜反射镜。材料组合为Mo/C、Mo/Si和Ni/C，层对为5-20，层厚为36- 100埃。用Cu-K（1.54A）、Si-K（7.13A）、Al-K（8.34A）、C-K（44.7A）四种特征X射线测量了多层膜的反射率、波长分辨率和反射阶的布拉格角<alpha><alpha><alpha><alpha>。进一步的研究是在高能物理国家实验室光子工厂和分子科学研究所利用14- 250 A波段的单色同步辐射进行的。在<alpha>掠入射条件下，Mo/C的Cu-K峰值反射率达到80%，而<lambda>在近垂直入射条件下，Mo/Si的160 A峰值反射率超过30%。