Analysis of Atomic Surface Structure Using In-Situ AFM

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In-situ characterization of solid(electrode)/solution interfaces is of particularly importance in electrochemical processes occurring at these interfaces. Recently, our group and several other groups have achieved atomic images of some metals or semiconductors at the electrode/solution interface using in situ scanning tunneling microscopy (STM). However, STM measurements has been limited to only electrically conductive materials in which the STM measures tunneling currents between the tip and the sample. On the contrary, the atomic force microscopy (AFM), which is one of the scanning probe microscopes, has been possible to measure the surface structure of nonconductive materials. In this study, we aimed at the development of in situ AFM methods at solid/solution interfaces.Following results were obtained in our studies so far.1)Vibration isolation systems, feed back circuits, and other components have been established using an STM apparatus in order to achieve an atomic resolution.2)Observations of atomic images of gold (Au) and adsorbed species have been achieved in STM measurements.3)AFM observations of atomic image of mica and graphite have been achieved in a pure water.4)AFM observations of step-terrace structures on Au(111) have been achieved under the potential controlled.5)Developments of a commercial available apparatus of AFM made by Seiko Instruments Inc. have been done. This fruit bases on our fundamental results as mentioned above.