The phase diagrams of the CdS-CdSe-CdTe pseudoternary system at 708ﾟC, 758ﾟC and 808ﾟC

CdS-CdSe-CdTe伪三元体系在708℃、758℃和808℃时的相图

• 批准号: 02650488
• 负责人: KATO Eiichi
• 金额: $ 1.34万
• 依托单位: Waseda University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for General Scientific Research (C)
• 财政年份: 1990
• 资助国家: 日本
• 起止时间: 1990 至 1991
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-02650488/
• 关键词: Phase Diagram; X-Ray diffraction; Mass spectorometry; II-VI Compound Semiconductors; Lattice constant

The phase diagrams of the CdS-CdSe-CdTe pseudoternary system at 708ﾟC, 758ﾟC and 808ﾟC were investigated by X-ray diffraction measurement.The samples were annealed at each temperatures for 1000 hours and quenched.At 808ﾟCzincblende type single-phase region, wurtzite single-phase region and two two-phase regions exist.At 758ﾟC and 708ﾟCzincblend type single-phase region, wurtzite type single-phase region and a two-phase region exist.And an isothermal evaporation method by means of a Knudsen cell-mass spectrometer combination has been applied to the determination of the phase boundary of the CdS rich side in the CdS-CdSe-CdTe system at the temperature of 688ﾟC.The phase boundary was determined by measuring the change of ion intensities as a function of composition.

用X射线衍射仪研究了在708ﾟC、758ﾟC和808ﾟC温度下的Cd S-Cd Se-Cd Te伪三元系相图。样品在不同温度下分别进行了1000h的退火和淬火。在808ﾟ闪锌矿类型的单相区、纤锌矿单相区和两个两相区。在758ﾟC和708ﾟ的混合型单相区，利用努森电池-质谱仪组合的等温蒸发法，在688kW的温度下，测定了Cd S-Cd Se-Cd Te系统中Cd S-Cd Se-Cd Te系统中富Cd侧的相界面。通过测量离子强度随组成的变化来确定相界面。