Development of Active Modulation Image Processing Ultra High Resolution Electron Microscope

主动调制图像处理超高分辨率电子显微镜的研制

• 批准号: 04555020
• 负责人: SHIMIZU Ryuichi
• 金额: $ 10.88万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research (B)
• 财政年份: 1992
• 资助国家: 日本
• 起止时间: 1992 至 1993
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-04555020/
• 关键词: active image processing; ultra high resolution electron microscope; aberration-free observation; real-time image processing; acceleration voltage modulation; staining free observation; 原子レベル像観察; 無収差像; 金微粒子; 焦点ブレ変調; 高圧変調

Research has been proceeded as planned. The results are summarized as follows ;(1) Accelerating voltage modulation type active modulation image processing electron microscope has been successfully developed. We drove the feed back circuit of high voltage power supply in order to superimpose the modulation voltage onto accelerating voltage. This enabled tailored defocus-modulation to be attained by high speed. The result has been reported in paper (1).(2) We have developed a novel defocus-modulation technique, called functionized irradiation time control method, This method is to control irradiation time of primary beam according to the weight function for defocus-modulation image processing. The first data were described in the paper (2).(3) Applying this functionized irradiation time control method for active image processing electron microscopy we succeeded in the aberration-free observation of Au-particle. This observation has confirmed that the position of Au-atoms can be determined accurately. (paper (3)).(4) We have been involved in application of this method for electron microscopic observation of biological samples under just-focus condition. It is noted that these biological samples are no more stained for electron microscopic observation. This reduces significantly the artifact caused by the staining.

研究工作已按计划进行。主要研究成果如下：(1)研制成功了加速型电压调制型主动调制图像处理电子显微镜。我们驱动高压电源的反馈电路，将调制电压叠加到加速电压上。这使得能够通过高速实现定制的散焦调制。(2)我们发展了一种新的散焦调制技术，称为功能化照射时间控制法，该方法是根据散焦调制图像处理中的权函数来控制初级光束的照射时间。(3)将这种功能化的辐照时间控制方法应用于主动图像处理电子显微镜，成功地实现了金粒子的无像差观测。这一观测证实了Au原子的位置可以被准确地确定。(4)将该方法应用于生物样品的正聚焦条件下的电子显微镜观察。值得注意的是，这些生物样本不再被染色以进行电子显微镜观察。这显著减少了染色引起的伪影。

项目成果

高井義造,谷口佳史,志水隆一: "Determination of Partially Coherent Parameters by Latlice Image Contrast in TEM" J.Electron Microscopy. 42. 7-13 (1993)

Yoshizo Takai、Yoshifumi Taniguchi、R​​yuichi Shimizu：“通过 TEM 中的晶格图像对比度确定部分相干参数”J.Electron Microscopy 42. 7-13 (1993)。

高井義造,谷口佳史,生田孝,志水隆一: "Spherical Aberration-free Observation of Profile Images of Au (011) Surface by Defocus-modulation Image Processing" Ultramicroscopy. 44. (in press) (1994)

Yoshizo Takai、Yoshifumi Taniguchi、Takashi Ikuta、Ryuichi Shimizu：“通过散焦调制图像处理对 Au (011) 表面的轮廓图像进行无球差观察”Ultramicroscopy 44。（出版中）（1994 年）。

安藤俊行,谷口佳史,高井義造,木村吉秀,志水隆一: "Development of Real-time Defocus Modulation Type Image Processing for Spherical-aberration-free TEM" Ultramicroscopy. 44(in press). (1994)

Toshiyuki Ando、Yoshifumi Taniguchi、Yoshizo Takai、Yoshihide Kimura、Ryuichi Shimizu：“无球面像差 TEM 的实时散焦调制型图像处理的开发”Ultramicroscopy（1994 年）。

高井義造,谷口佳史,志水隆一: "Determination of Partially Coherent Parameters by Lattice Image Contrast in TEM" J. Electron Microscopy. 42. 7-13 (1993)

Yoshizo Takai、Yoshifumi Taniguchi、R​​yuichi Shimizu：“通过 TEM 中的晶格图像对比度确定部分相干参数”J. 电子显微镜 42. 7-13 (1993)。

安藤俊行,谷口佳史,高井義造,木村吉秀,志水隆一: "Active Image Processing as Applied to High Resolution Electron Microscopy" J.Electron Microscopy. 43. 10-15 (1994)

Toshiyuki Ando、Yoshifumi Taniguchi、Yoshizo Takai、Yoshihide Kimura、Ryuichi Shimizu：“应用于高分辨率电子显微镜的主动图像处理”J.Electron Microscopy。