Development of Scanning Reflection Electron Holography Microscopy (SREHM)
Development of Scanning Reflection Electron Holography Microscopy (SREHM)
批准号:
05402028
负责人:
SHIMIZU Ryuichi
金额:
$10.69万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (A)
财政年份:
1993
资助国家:
日本
项目状态:
已结题
起止时间:
1993 至 1994
中文摘要
研制了扫描型反射式电子束全息显微镜。通过本课题的研究,取得了如下成果。(1)首次研制了超高真空反射式电子显微镜,并在此显微镜下成功地观察到Pt(100)表面的重构畴(论文#1)。(2)设计了一种新型的SREHM样品保持器。该保持器使得能够以高精度控制入射角和方位角的沿沿着X和Y方向的移位和旋转。(3)成功地获得了沿着超导导线电场的显微图及其全息图。(4)建立了一套具有红外辐射加热系统和Zr-O/W(100)TF发射体的SREHM系统,并取得了初步的实验结果,证实了SREHM的巨大潜力(5)
英文摘要
Scanning type reflection electron beam holography microscopy (SREHM) has been developed. The resualts obtained though the present research project are as follows.(1) UHV Reflection electron microscope was, first, developed and we succeeded to observe the reconstructed domains on Pt(100) under this microscope (paper #1)(2) A new type sample holder for the SREHM ws also designed. This holder enables shifts along X and Y directions and rotation for incident and azimuthal angles to be controlled with high precision. (paper #2)(3) Micro mapping of electric field along superconducting wire and its hologram have been successfully obtained. (paper #4)(4) The SREHM system with infrared-radiation heating system and Zr-O/W(100) TF emitter has been contructed, and a prelimary result was enconrageous enough to confirm very high potentiality of the SREHM (paper #5)
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白永煥,関敬烈,井上雅彦,木内正人,志水隆一: "Reflection High Energy Electron Diffraction Observation of Dynamic Ion Beam Process in Titanium Nitride Crystal Growth" Jpm.J.Appl.Phys.32. 4714-4717 (1993)
Hiroshi Shiranaga、Takayoshi Seki、Masahiko Inoue、Masato Kiuchi、Ryuichi Shimizu:“氮化钛晶体生长中动态离子束过程的反射高能电子衍射观察”Jpm.J.Appl.Phys.32 (1993)。
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K.Ogai,Y.Kimura,R.Shimizu: "Dynamic Observation of Microelectric Field in Oxide Superconducting Material by Electron Interference Microscopy" Ultramicroscopy. 54. 345-350 (1994)
K.Ogai,Y.Kimura,R.Shimizu:“通过电子干涉显微镜动态观察氧化物超导材料中的微电场”超显微镜。
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T.Akita, M.Takeguchi and R.Shimizu: ""Observation of Reconstructed Pt(001) Surfacely Reflection Electron Microscopy"" Jpn. J.Appl. Phys.32. L1631-L1634 (1993)
T.Akita、M.Takeguchi 和 R.Shimizu:“重建 Pt(001) 表面反射电子显微镜的观察”Jpn。
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K.Ogai,S.Matsui,Y.Kimura,R.Shimizu: "An Approach for Nanolithography Using Electron Holograpy" Japan J. Appl.Phys.32. 5988-5992 (1993)
K.Ogai、S.Matsui、Y.Kimura、R.Shimizu:“使用电子全息技术的纳米光刻方法”Japan J. Appl.Phys.32。
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K.Ogai, S.Matsui, Y.Kimura and R.Shimizu: ""An Approach for Nanolithography Using Electron Holography"" Japan J.Appl. Phys.32. 5988 (1993)
K.Ogai、S.Matsui、Y.Kimura 和 R.Shimizu:““使用电子全息术的纳米光刻方法””Japan J.Appl。
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共 12 条
Real-Time Active Modulation Electron Microscopy
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批准号:07555024
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$10.88万
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财政年份:1995
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负责人:SHIMIZU Ryuichi
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依托单位:
Development of Active Modulation Image Processing Ultra High Resolution Electron Microscope
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批准号:04555020
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项目类别:Grant-in-Aid for Developmental Scientific Research (B)
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资助金额:$10.88万
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财政年份:1992
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负责人:SHIMIZU Ryuichi
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依托单位:
Secondary Ion Generation Mechanism Studied by Multi-photon Excima Laser Ionization
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批准号:01460084
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项目类别:Grant-in-Aid for General Scientific Research (B)
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资助金额:$4.03万
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财政年份:1989
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负责人:SHIMIZU Ryuichi
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依托单位:
Development of Zr/W - Gun for nano-meter Auger Electron Microprobe
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批准号:61850013
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项目类别:Grant-in-Aid for Developmental Scientific Research
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资助金额:$5.57万
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财政年份:1986
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负责人:SHIMIZU Ryuichi
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依托单位: