Real-Time Active Modulation Electron Microscopy

实时主动调制电子显微镜

• 批准号: 07555024
• 负责人: SHIMIZU Ryuichi
• 金额: $ 10.88万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (A)
• 财政年份: 1995
• 资助国家: 日本
• 起止时间: 1995 至 1996
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07555024/
• 关键词: Active Modulation Processing; Accelerating voltage Modulation; Real-time Processing; Spherical-Aberration-Free Observation; High-Resolution Electron Microscopy; 無収差電子顕微鏡法; 実時間変調処理法; 位相像分解観察; 実時間画像処理; 位相コントラスト; 高圧変調; 電子顕微鏡

The results obtained through the present research project are as follows :(1) Accelerating voltage modulation system for real-time active modulation processing has been successfully constructed.(2) Modulation signals which has been derived from the characteristics of electron optical system was transformed through optical fiber to the modulation system installed in high voltage tank.(3) The deformation of modulation signals due to the response of feedback system of accelerating voltage power supply was successfully compensated by overlapping the correction signals onto the modulation signals.(4) We have been involved in observing unstained biological samples under the real-time active modulation electron microscope and high contrast image have been observed so far.However, the stability of the entire electron microscope has been gradually deteriorating and this limited the high-resolution observation.

本课题的研究成果如下：(1)成功构建了用于实时有源调制处理的加速电压调制系统。(2)从电子光学系统的特性出发，通过光纤将调制信号传输到安装在高压水箱中的调制系统。(3)通过将校正信号叠加到调制信号上，成功地补偿了由于加速电压电源反馈系统的响应而产生的调制信号的变形。(4)我们参与了实时有源调制下对未染色生物样品的观察，目前已观察到高对比度的电子显微镜图像整个电子显微镜的稳定性一直在逐渐恶化，这限制了高分辨率的观察。

项目成果

T.Ando, H.Utsuro, T.Ikuta, Y.Kimura, Y.Takai and R.Shimizu: "A practical method for real-time active modulation electron microscopy-Optimization of driving-signal for active accelerating-voltage modulation." Optik. 104. 163-165 (1997)

T.Ando、H.Utsuro、T.Ikuta、Y.Kimura、Y.Takai 和 R.Shimizu：“实时主动调制电子显微镜的实用方法 - 主动加速电压调制的驱动信号优化。”

松尾 浩: "Development of a Nanoprobe Cathodoluminescence Scanning Electron Microscope" J Electron Microsc.Vol.45 No.5. 453-457 (1996)

Hiroshi Matsuo：“纳米探针阴极发光扫描电子显微镜的开发”J Electron Microsc.Vol.45 No.5 (1996)。

H.Matsuo, N.Kobayashi, Y.Kimura and R.Shimizu: "Development of a Nanoprobe Cathodeluminescence Scanning Electron Microscope" J.Electron Microsc.45. 453-457 (1996)

H.Matsuo、N.Kobayashi、Y.Kimura 和 R.Shimizu：“纳米探针阴极发光扫描电子显微镜的开发”J.Electron Microsc.45。

Y.Takai,N.Oba,T,Ando T,Ikuta and R.Shimizu: "Extraction of Spherical and Chromatic Aberration-free Information by Focal-depth Extension Processing UnderTilted Illumination" J.Electron Microscopy. 44. 8-14 (1995)

Y.Takai、N.Oba、T、Ando T、Ikuta 和 R.Shimizu：“通过倾斜照明下的焦深扩展处理提取无球差和色差信息”J.Electron Microscopy。