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Developmsnt of scanning optical probe microscope using a metallic probe

Developmsnt of scanning optical probe microscope using a metallic probe
使用金属探针的扫描光学探针显微镜的研制
批准号:
05555228
负责人:
MINAMI Shigeo
金额:
$12.42万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research (B)
财政年份:
1993
资助国家:
日本
项目状态:
已结题
起止时间:
1993 至 1995

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中文摘要
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英文摘要
We applied the near-field scanning optical microscope (NSOM) using a metallic probe tip to biological samples. In testing with murine embryonal myocardial cell as a sample, we can observe the fine structure (the variance of refractive index) in our NSOM images. This structure cannnot be observed by a scanning electrontunneling microscope (STM). In addition, we clarify that 1) NSOM images are different to the surface profile of samples, and that 2) their contasts vary with the polarizing state of illumination, and that 3) the interference of the evanescent wave is localized on the sample surface of periodical structure.We developed our metal-tip NSOM to a reflecting-mode system. Therefore, we can apply it to apply the nontransparent samples, such as semi-conductor or metallic samples, which cannot be observed by a former transparent mode system. To estimate resolving performance of this system, we use the semi-conducting materials as a sample, whose surface has periodical structure with a period of 240 nm. In experiments, we can observe the localization of the electromagnetic field with a spatial resolution of 60nm.Electromagnetic simulations of the metal-tip NSOM have carried out in 3D model using realistic size and materials. A results of calculation confirmes that there is high electric intensity at the apex of the metallic tip, which is about 40 times greater than the incident light. This result shows that the metal-tip NSOM system can extract the nanometric optical information at the vicinity of the tip apex, and that new imaging system will be available, if it is combined with nonlinear optics such as two photon absorption or SHG.This may make effective use of field enhancement of the tip.
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会议论文
Y. Inouye: "A scanning near-field option microscope having scanning electron tunneling microscope cavability using a single metallic probe tip." Journal of Microscopy. 178. 14-19 (1995)
Y. Inouye:“一种扫描近场选项显微镜,具有使用单个金属探针尖端的扫描电子隧道显微镜腔。”
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通讯作者:
Y.Inouye, S.Kawata: "Scanning near-field optical and tunnineling microscope using a single metallic probe tip and its application" International Conference on Near Field Optics, Proc.57-58 (1995)
Y.Inouye, S.Kawata:“使用单个金属探针尖端的扫描近场光学和隧道显微镜及其应用”国际近场光学会议,Proc.57-58 (1995)
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通讯作者:
S. Kawata: "Scanning Probe Optical Microscopy Using a Metallic Probe Tip." Ultramicroscopy. 57. 313-317 (1995)
S. Kawata:“使用金属探针尖端扫描探针光学显微镜。”
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通讯作者:
S. Kawata: "New Microscopes and their Industrial Applications" First Finnish-Japanese meeting: Optics in Engineering. 99-101 (1995)
S. Kawata:“新型显微镜及其工业应用”首次芬兰-日本会议:工程光学。
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40
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