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High resolution electron microscopy and atomic force microscopy of grain boundary and surface of minerals

矿物晶界和表面的高分辨率电子显微镜和原子力显微镜

基本信息

批准号：
07640645
负责人：
UEHARA Seiichiro
金额：
$ 1.47万
依托单位：
KYUSHU UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
1995
资助国家：
日本
起止时间：
1995 至 1996
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07640645/
关键词：
HRTEM imaging plate AFM mica clay minerals illite carbon materials serpentine minerals antigorite セリサイト

项目摘要

1.In high resolution transmission electron microscopy (HRTEM) characteristics of a new imaging plate, which was invented in 1995 by Fuji Photofilm Co., was investigated and experimental conditions for high resolution imaging using imaging plate were shown. Fine texture and structure of minerals, such as antigorite, mica clay minerals, interstratified minerals, feldspars and apatite were studied. Electron sensitive minerals, for example, antigorite and mica minerals were could not obtained through focus images using a conventional photographic film. Whereas through focus images of these minerals were obtained using imaging plate, which has higher sencitivity than photographic films. Now I research atomic resolution imaging for these minerals using by image processing in progress.2.In atomic force microscopy (AFM) mica clay minerals and kaolin minerals of hydrothermal origin and carbon materials syntesized by hot-filament CVD were investigated.A comparative study of contact mode and tapping mode was made for mica clay minerals. In the height images of both mode, only in tapping mode interlacing pattern on mica clay minerals, which show spiral growth, was obatinded. Whereas, in the deflection image of contact mode and deflection and amplitude image of tapping mode, interlacin patterns on mica crystals were obatined.Habit modification of carbon synthesized by CVD was investigated. Carbon, excepting for diamoned, changed their morphology from ball-like aggregate, carbon whisker, thin-film carbon tube with decreasing subsytate temperature. AFM,SEM and TEM image of carbon materials were compered in details and showed the low resosultion limits of AFM.Micrometer scale roughness on substrate give a serious artifacts in AFM image.

1.在高分辨率透射电子显微镜（HRTEM）中，研究了富士胶片公司于1995年发明的新型成像板的特性，并展示了使用成像板进行高分辨率成像的实验条件。对叶蛇纹石、云母粘土矿物、层间矿物、长石、磷灰石等矿物的细小结构和结构进行了研究。电子敏感矿物，例如叶蛇纹石和云母矿物，无法通过使用传统照相胶片的聚焦图像获得。而这些矿物的聚焦图像是使用成像板获得的，成像板比照相胶片具有更高的灵敏度。目前我正在研究利用图像处理对这些矿物进行原子分辨率成像。2.在原子力显微镜(AFM)中对热液成因的云母粘土矿物和高岭土矿物以及热丝CVD合成的碳材料进行了研究。对云母粘土矿物进行了接触模式和敲击模式的比较研究。在两种模式的高度图像中，仅在敲击模式下获得云母粘土矿物呈螺旋状生长的交错图案。而在接触模式的偏转图像和敲击模式的偏转和振幅图像中，获得了云母晶体上的交错图案。研究了CVD合成碳的习性改变。随着基质温度的降低，除金刚石外的碳的形态发生了变化，从球状聚集体、碳晶须、薄膜碳管。对碳材料的AFM、SEM和TEM图像进行了详细比较，显示了AFM的低分辨率极限。基材上的微米级粗糙度在AFM图像中产生了严重的伪影。