Electron spectroscopic microscopy of state analysis and microstructure of minerals

近年来，电子光谱透射电子显微镜（ES-TEM）已广泛应用于材料科学领域。现在ES-TEM也被称为能量过滤TEM（EF-TEM）。这种新的TEM能够应用快速和非常有效的电子光谱成像（ESI）工具进行矿物表征和记录EELS光谱。本研究采用新型EF-TEM（JEOL-2010 FEF）和JEOL JEM 4000 EX（Gatan imaging filter）对轻元素（Li、Be、B）进行定性分析，对“新沙玉”（红釉）中铜沉淀物的纳米结构进行定性分析，并对CVD法制备的碳材料进行化学状态分析。尽管锂辉石的LiK边缘很微弱。(2)在红釉中发现了许多直径约为20 nm的球形铜沉淀物，其EELS谱与金属铜相似。(3)用EF-TEM和常规平行EELS获得了碳材料（金刚石和石墨）的EELS谱，两种谱具有相同的分辨率。

Recently electron spectroscopic transmission electron microscopy (ES-TEM) has been using in material sciences. Now ES-TEM is also called energy filtering TEM (EF-TEM) . This new TEM gives the ability to apply the fast and very efficient tool of electron spectroscopic imaging (ESI) for mineral characterization and to record EELS spectra. In this study a new EF-TEM (JEOL-2010FEF) and JEOL JEM4000EX with GIF (Gatan imaging filter) was used for qualitative analysis of light elements (Li, Be, B), nano-structure of a copper precipitate in "Shinsha-Yu (red glaze) and chemical state analysis of carbon materials made by CVD.The following results are obtained :(1) Li in spodumene, Be in beryl, B in elbaite were able to detected in EELS spectra. Although, LiK edge from spodumene is very faint.(2) Many spherical copper precipitates of 20 nm in size are found in red glaze, the copper precipitates show EELS spectrum similar to metal copper.(3) EELS spectra of carbon materials (diamond and graphite) were obtained by EF-TEM and conventional parallel EELS.The both spectra have same resolution.