Imaging-ellipsometer

具有椭圆孔率测定功能的设备包括在温度控制下测量成像以及与流体接触的选项，使得可以研究孔径分布、官能化和结构对分子吸附和解吸的影响以及不同极性的蒸气和与蒸气或流体接触时在薄多孔膜上的溶胀行为。由于材料量小，这对于其他方法几乎是不可行的，并且不具有沿着层厚度（拟合模型）以及在区域（成像）中的同时局部信息。这种技术不仅可以检测否则难以接近的样品中的孔径分布，而且还可以研究润湿（功能化）或孔结构与运输或选择性蒸汽吸附的相互作用。例如，这对于以下调查是必要的：（i）推导薄膜/分离层中的孔径分布（d ~1 μm至几nm）也具有沿膜厚度沿着的不对称官能化和结构，其仅被研究用于传输过程的对准，以及它们通过聚合物在纳米级孔中的官能化或溶胀/蒸气吸附的改性，ii）聚合物层和中孔层与蒸气和温度控制液体接触时的溶胀行为，iii）研究润湿影响和纳米级限制对蒸气吸附和解吸的影响，例如在运输和分离过程中。例如在运输和分离过程的情况下。虽然在达姆施塔特工业大学的几个部门使用简单的椭圆偏振仪来确定薄膜的层厚度和折射率，包括一个可以在空气中测量到高温的设备，和一些研究小组也进行粉末的蒸汽吸附，不可能研究薄的中孔和可溶胀层，因此不可能研究非常少量的材料的孔径分布和它们的蒸气吸附，不同极性蒸汽的行为作为功能化和结构特性的函数。为了测量和评估吸附等温线，非常精确地设置分压以及自动测量和评估所获得的测量数据至关重要。如果分压设置不精确，吸附和解吸曲线位于彼此的顶部，并且不可能导出结构-性质关系。此外，用于确定孔径分布的自动数据评估对于有效测量是重要的。此外，与流体接触的测量的温度控制至关重要，尤其是对于可膨胀和温度敏感的表面。例如，温度控制的材料变化及其对运输或释放过程的影响变得可访问，因此结构-性能关系的推导是可能的。

A device with ellipsoporosimetry function including the option to measure imaging as well as in contact with fluids under temperature control makes it possible to investigate pore size distributions, the influence of functionalisation and structure on adsorption and desorption of molecules as well as of differently polar vapours and swelling behaviour in contact with vapours or fluids on thin porous films. Due to the small amount of material, this is hardly feasible with other methods and not with simultaneous local information along the layer thickness (fit models) as well as in the area (imaging). This technique allows not only to detect pore size distribution in otherwise inaccessible samples, but also to investigate the interaction of wetting (functionalisation) or pore structure and transport or selective vapour adsorption. This is, for example necessary for the following investigations: (i) derivation of the pore size distribution in thin films/ separating layers (d ~1 µm to a few nm) also with asymmetric functionalisation and structure along the film thickness, which are just being investigated for the alignment of transport processes, and their modification by functionalisation or swelling/vapour sorption of polymers in nanoscale pores, ii) Swelling behaviour of polymer layers and mesoporous layers in contact with vapours and temperature-controlled liquids, iii) Investigation of wetting influences and nanoscale confinement on vapour adsorption and desorption, e.g. in the context of transport and separation processes. e.g. in the context of transport and separation processes. Although several departments at the TU-Darmstadt use simple ellipsometers to determine the layer thickness and refractive index of thin films, including a device that can measure in air up to high temperatures, and a few research groups also perform vapour sorption on powders, there is no possibility to investigate thin mesoporous and swellable layers and thus very small amounts of material for their pore size distribution and their vapour sorption behaviour of differently polar vapours as a function of functionalisation and structural properties. In order to measure and evaluate sorption isotherms, the extremely precise setting of the partial pressure and the automated measurement and evaluation of the measurement data obtained are crucial. If the partial pressure setting is not precise, the adsorption and desorption curves lie on top of each other and it is not possible to derive structure-property relationships. Furthermore, automated data evaluation to determine the pore size distribution is important for efficient measurements. Furthermore, temperature control for measurements in contact with fluids is crucial, especially for swellable and temperature-responsive surfaces. For example, temperature-controlled material changes and their effect on transport or release processes become accessible and thus the derivation of structure-property relationships is possible.