Spectroscopic Ellipsometer

奥格斯堡大学物理研究所的实验物理学IV主席在薄膜系统领域进行基础和应用研究。这些材料包括有机半导体（例如用于显示应用的有机发光二极管）、用于数据存储的磁性薄膜、用于热电或光电化学电池的复合氧化物以及金刚石层。其中光谱椭圆偏振法在其光学特性中起着核心作用。它探测光的偏振态的变化，因为它穿透（多）层堆叠的材料正在研究中，并产生重要的信息层的厚度和它们的复折射率。此外，它还提供了有关材料光学各向异性的信息，这些信息需要通过测量仪器和所使用的分析软件来捕获。我们申请了一种新的光谱椭偏仪，以取代一个20岁的仪器，这是不再是最先进的。椭偏是我们的小组进行各种薄膜系统的光学分析，这是我们的研究重点的基本重要性。具体来说，在这个提案中，我们计划解决有机半导体薄膜以及复合氧化物。该技术的可用性对于获得和实施第三方资助的研究项目具有战略重要性，详见提案。

The Chair of Experimental Physics IV within the Institute of Physics at the University of Augsburg performs fundamental as well as applied research in the field of thin-film systems. These include, inter alia, organic semiconductors (e.g. organic light-emitting diodes for display applications), magnetic thin films for data storage, complex oxides for thermos-electrics or photo-electrochemical cells as well as diamond layers. Therein spectral ellipsometry plays a central role for their optical characterisation. It probes changes of the polarization state of light as it penetrates a (multi-)layer stack of the materials under study and yields important information on layer thicknesses and their complex refractive indices. Furthermore, it gives information on optical anisotropy of the materials, which needs to be captured by both the measurement instrumentation as well as the used analysis software. We apply for a new spectroscopic ellipsometer to substitute a 20-year old instrument, which is no longer state of the art. Ellipsometry is of fundamental importance for our group to perform optical analyses of a variety of thin films systems, which are in the focus of our research. Specifically, within this proposal we plan to address organic semiconducting thin films as well as complex oxides. The availability of this technique is of strategic importance for the acquisition and implementation of third-party funded research projects, as detailed in the proposal.