Spectroscopic Ellipsometer

奥格斯堡大学物理研究所内的第四实验物理教席负责薄膜系统领域的基础和应用研究。除其他外，这些材料包括有机半导体(例如用于显示应用的有机发光二极管)、用于数据存储的磁性薄膜、用于热电或光电化学电池的复合氧化物以及金刚石层。其中，光谱椭偏测量法在它们的光学表征中起着核心作用。它探测光穿透被研究材料的(多)层堆叠时偏振态的变化，并产生关于层厚度及其复杂折射率的重要信息。此外，它还提供了有关材料的光学各向异性的信息，这些信息需要通过测量仪器和使用的分析软件来捕获。我们申请了一台新的光谱椭偏仪来取代一台有20年历史的旧仪器，这已经不再是最先进的了。椭圆偏振测量仪对于我们的团队进行各种薄膜系统的光学分析是至关重要的，这也是我们研究的重点。具体地说，在这项提案中，我们计划处理有机半导体薄膜以及复合氧化物。这项技术的提供对第三方资助的研究项目的获取和实施具有战略重要性，如提案中所详细说明的那样。

The Chair of Experimental Physics IV within the Institute of Physics at the University of Augsburg performs fundamental as well as applied research in the field of thin-film systems. These include, inter alia, organic semiconductors (e.g. organic light-emitting diodes for display applications), magnetic thin films for data storage, complex oxides for thermos-electrics or photo-electrochemical cells as well as diamond layers. Therein spectral ellipsometry plays a central role for their optical characterisation. It probes changes of the polarization state of light as it penetrates a (multi-)layer stack of the materials under study and yields important information on layer thicknesses and their complex refractive indices. Furthermore, it gives information on optical anisotropy of the materials, which needs to be captured by both the measurement instrumentation as well as the used analysis software. We apply for a new spectroscopic ellipsometer to substitute a 20-year old instrument, which is no longer state of the art. Ellipsometry is of fundamental importance for our group to perform optical analyses of a variety of thin films systems, which are in the focus of our research. Specifically, within this proposal we plan to address organic semiconducting thin films as well as complex oxides. The availability of this technique is of strategic importance for the acquisition and implementation of third-party funded research projects, as detailed in the proposal.