INVESTIGATION OF ELECTRON BEAM ANALYZER FOR OBSERVING THE SPECIMEN IN THE AIR
INVESTIGATION OF ELECTRON BEAM ANALYZER FOR OBSERVING THE SPECIMEN IN THE AIR
批准号:
07805008
负责人:
SUGA Hiroshi
金额:
$0.32万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1995
资助国家:
日本
项目状态:
已结题
起止时间:
1995 至 1996
中文摘要
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英文摘要
This project is concerned with the development of electron beam analyzer for obsevcing the specimen in the air by using Oligo-scattering electron beam which is using for ESEM.The Oligo-scattering phenomenon in the Be or C foil and air is studied by the theoretical analysis and digital simulation. And the conditions which should be considered in design of the device is reauested.First of all, the requirement to take out Oligo scattering electron beam into air through the Be foil is theoretically derived. Next, the simulation program developed to analyze Oligo-scattering phenomenon is described. This program is based on the Monte Carlo simulation by which the single scattering model is adopted and it is the one with a wide range of application to give the result which is corresponding to analysis and the experimental result well so far.It is shown to be able to calculate the behavior of the electron in the Be or C foil and the air layr (or, substituted gas layr) and to use Oligo-scattering beam within the range of the size which can be achieved by the simulation program. And it is confirmed that Oligo-scattering beam reached the specimen surface by passing the foil and the air layr, and generated back scattering elecrons which can be used for image processing in the model size proposed here. According to the calcuation, several nm spot diameter on the specimen surface could be obtained and the reflection rate of electrons could be 7% forE=40keV,L (Be) =0.2mum and L (Air) =200mum.
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H.Kumano,Z.Gang,M.kotera,H.Suga: "空気中試料観測用電子顕微鏡の実現可能性" Memoirs of the Osaka Institute of Technology Series. A40.1. 39-47 (1995)
H.Kumano、Z.Gang、M.kotera、H.Suga:“观察空气中样品的电子显微镜的可行性”大阪工业大学回忆录 A40.1 (1995)。
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通讯作者:
T.Kijima,M.kotera,H.Suga,Y.nakase: "Monte Carlo Calculations on the Passage of Electrons through" Thin Films Irradiated by 300ke V Electrons IEICE Transaction of Electronics. E78-C. 557-563 (1995)
T.Kijima、M.kotera、H.Suga、Y.nakase:“电子通过 300ke V 电子照射薄膜的蒙特卡罗计算”IEICE Transaction of Electronics。
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作者:
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通讯作者:
T.Kijima,M.kotera,H.Suga,Y.nakase: "Monte Carlo Calculations on the Passage of Electrons through" Thin Films Irradiated by 300keV Electrons IEICE Transaction on Electronics. E78-C. 557-563 (1995)
T.Kijima、M.kotera、H.Suga、Y.nakase:“电子通过 300keV 电子辐照薄膜的蒙特卡罗计算”IEICE Transaction on Electronics。
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发表时间:
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影响因子:
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作者:
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通讯作者:
T.Kijima, M.Kotera, H.Suga, Y.nakase: "Monte Carlo Calculations on the Passage of Electrons through" Thin Films Irradiated by 300keV Electrons IEICE Transaction on Electronics. E78-C. 557-563 (1995)
T.Kijima、M.Kotera、H.Suga、Y.nakase:“电子通过 300keV 电子辐照薄膜的蒙特卡罗计算”IEICE Transaction on Electronics。
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通讯作者:
Z.Gang, H.Kumano, M.Kotera, H.Suga: "Application of Oligo-Scattering Beam to Electron Beam Analyzer for Observing the Specimen in the Air" IEICE Transaction. (accepted). (1997)
Z.Gang、H.Kumano、M.Kotera、H.Suga:“寡散射束在电子束分析仪中用于观察空气中样本的应用”IEICE 交易。
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