Novel X-ray interferometer with a normal incidence and its applications

在本研究中，我们旨在设计和制造一种新型的具有不同光程长度的x射线干涉仪，并结合具有纵向相干长度的核共振过滤x射线。它由一组面对面排列的两个晶片组成，其中满足布拉格角在π /2附近的衍射条件。两个平板之间发生多次反射，导致干扰。^<57>Fe核的核共振散射是理想的候选，其跃迁能为14.4 keV。因此，核滤过的14.4 keV x射线应满足正入射条件，并且我们发现石英晶体的0 - 6 - 10反射是达到此目的的最佳条件。为了实现这种新型的同步辐射干涉仪，我们进行了基础实验。研究了石英6010在法向入射条件下的反射率和透射率。用新的正入射法精确地测定了石英（0 ~ 6 ~ 10）的晶格参数，发现核滤过的14.4 keV x射线在95‰时可以实现π /2处的Bragg反射。采用Si（12.4 0）和石英（0.6 10）的平行设置来评价石英晶体的完美性。摇摆曲线的轮廓和地形告诉我们，它的完美是可取的。我们制作了石英的Bonse-Hart干涉仪，但没有观察到明显的干涉。改进切削工艺可使干涉成为可能。最后，我们提出了用这种x射线干涉仪来确定晶体因子相位的新方法，从x射线光学的角度来看，这种方法与其他方法有很大的不同。

In this research we aimed to design and making of a novel X-ray interferometer with different optical path lengths combined with a nuclear resonantly filtered X-ray which has a longitudinal coherence length. It composed of a set of two crystal plates arranged face to face in which the diffraction condition with a Bragg angle near pi/2 is satisfied. Multiple reflection is occurred between two plates and leads to the interference. The nuclear resonant scattering by the ^<57>Fe nuclei is a desirable candidate and its transition energy is 14.4 keV.So the nuclear filtered 14.4 keV X-ray should satisfy the normal incidence condition and we have found that 0 6 10 reflection by the quarts crystal is best for this purpose.We performed the fundamental experiments to realize this novel interferometer using the synchrotron radiation. The reflectivity and transivity of quartz 0 6 10 at the normal incidence condition was investigated. The lattice parameter of quartz (0 6 10) was precisely determined by the new normal incidence method and we found that the Bragg reflection just at pi/2 of the nuclear filtered 14.4 keV X-ray will be realized at 95ﾟC.The perfection of quartz crystal was evaluated by the parallel setting of Si (12 4 0) and quartz (0 6 10). The profile of the rocking curve and the topography told us that its perfection was desirable. We made Bonse-Hart type interferometer of the quartz but the clear interference was not observed. Improvement of the cutting process may enables the interference. Finally we proposed the new method which determine the phase of the crystal factor using this X-ray interferometer and is quite defferent from other methods from the view point of X-ray optics.