Research of 3 Dimensional (3D) MOSFET's operation mechanism for future LSI
Research of 3 Dimensional (3D) MOSFET's operation mechanism for future LSI
批准号:
08455158
负责人:
ENDOH Tetsuo
金额:
$4.99万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1996
资助国家:
日本
项目状态:
已结题
起止时间:
1996 至 1998
中文摘要
(1)三维金属氧化物半导体(MOS)晶体管工作机理研究分析了SGT型三维MOS晶体管的工作机理。特别地,我们分析了SGT型3D MOS晶体管的静态1-V特性与器件结构(如硅柱直径和栅极氧化物厚度)的关系。因此,我能够提取出固定性能的SGT型3D MOS晶体管的结构参数。结论利用这些分析结果,我们提出了SGT型MOS晶体管工作机理的新模型。特别成功地研制出了SGT型MOS晶体管的电压-电流特性。因此,我们明确了限制未来3D MOS晶体管的运算速度、运算功率和小尺寸的因素。研究结果对未来的大规模集成电路具有重要意义。
英文摘要
(1) Study of operation mechanism for 3 dimensions (3D) metal oxide semiconductor (MOS) transistorWe analyzed operation mechanism of SGT type 3 D MOS transistors. Especially, we analyzed the dependence of the static 1-V characteristic for SGT type 3D MOS transistor on the device structure, for example, silicon pillar diameter, and gate oxide thickness. As a result, I was able to extract the construction parameters that are fixed performance of SGT type 3D MOS transistor.ConclusionsWith using these analysis results until this year, we propose new models of operation mechanism for SGT type MOS transistor. Especially, It was successful in formulations making the voltage-current characteristics of SGT type MOS transistor. As a result, we made clear the factors that limit operation speed, operation power and small size for a future 3D MOS transistor. The results are very important for a future LSI.
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遠藤哲郎: "完全空乏型Double-Gate SOI MOSFETの短チャネル効果の解析及びスケーリング理論の提案" 電気情報通信学会論文誌C-II. J82-C-II・No.2. 72-73 (1999)
Tetsuro Endo:“全耗尽双栅极 SOI MOSFET 的短沟道效应分析和缩放理论的建议”IEICE Transactions J82-C-II·No.2 (1999)。
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Tetsuo ENDOH: "An Accurate Model of Fully-Depleted Surrounding Gate Transistor (FD-SGT)" IEICE TRANSACTIONS ON ELECTRONICS. E80-C,No.7. 905-910 (1997)
Tetsuo ENDOH:“全耗尽环栅晶体管 (FD-SGT) 的精确模型”IEICE 电子交易。
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Tetsuo, ENDOH: "An Accurte Model of Fully-Depleted Surrounding Gate Transistor(FD-SGT)" IEICE TRANS.ELECTRON.E80-C・No.7. 905-910 (1997)
Tetsuo, ENDOH:“全耗尽环栅晶体管(FD-SGT)的精确模型”IEICE TRANS.ELECTRON.E80-C·No.7(1997)。
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Tetsuo ENDOH: "An Analytic Steady-State Current-Voltage Characteristics of Short Channel Fully-Depleted Surrounding Gate Transistor(FD-SGT)" IEICE TRANSACTIONS ON ELECTRONICS. E80-C・No.7. 911-917 (1997)
Tetsuo ENDOH:“短沟道全耗尽环栅晶体管(FD-SGT)的稳态电流-电压特性分析”IEICE TRANSACTIONS ON ELECTRONICS(电子学报)E80-C·No.7(1997)。
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Tetsuo ENDOH: "Analysis of short channel effects and proposal of scaling theory in Fully-Depleted Double-Gate SOI MOSFET" IEICE TRANSACTIONS ON ELECTRONICS C-II. J82-C-II,No.2. 72-73 (1999)
Tetsuo ENDOH:“全耗尽双栅 SOI MOSFET 中短沟道效应的分析和缩放理论的提出”IEICE TRANSACTIONS ON ELECTRONICS C-II。
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共 11 条
Study for Intermediate States of Spin Flip in Spintronics Devices and its Applications
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批准号:23656006
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项目类别:Grant-in-Aid for Challenging Exploratory Research
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资助金额:$2.5万
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财政年份:2011
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负责人:ENDOH Tetsuo
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批准号:19206037
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项目类别:Grant-in-Aid for Scientific Research (A)
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财政年份:2007
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负责人:ENDOH Tetsuo
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Investigation of high performance three-dimensional integrated circuits using three dimensional MOS devices
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批准号:10555112
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$8.13万
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财政年份:1998
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负责人:ENDOH Tetsuo
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依托单位: