Application of Microbeam X-Ray Diffraction Study by Using Synchrotron Radiation Source to the Investigation of Fracture of Materials.

同步辐射源微束X射线衍射研究在材料断裂研究中的应用。

• 批准号: 10650099
• 负责人: YOSHIOKA Yasuo
• 金额: $ 1.79万
• 依托单位: Musashi Institute of Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 1998
• 资助国家: 日本
• 起止时间: 1998 至 2000
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-10650099/
• 关键词: Synchrotron Radiation Source.; Microbeam X-Ray Diffraction; X-Ray Stress Analysis.; X-Ray Fractography.; Stress Intensity Factor.; Sub-grain.; Residual Stress; 副結晶; 疲労破壊; 塑性変形; デバイシェラー像; デバイシェラー写真

A cyclic plastic zone area near fatigue-fractured surface was studied using a back-reflection camera and high intensity, microbeam, synchrotron radiation X-ray source (SR) in order to measure the variation of the stress intensity factor range (ΔK) along the fatigue fracture.The existence of subgrains within the cyclic plastic region was shown by the appearance of small spots in the Debye-Scgerrer rings of the imaging plate. This effect did not exist outside of the cyclic plastic area. The size of the cyclic plastic zone below the surface was estimated from the relation between the number of spots in a Debye-Scherrer ring and the depth from the fracture surface. ΔK was measured from this relation. A synchrotron X-ray source made these measurements possible within a high positional resolution and a reasonable period of exposure time.Such microbeam X-ray diffraction technique is also applicable on the measurement of residual stress in localized region of single crystal and residual stresses in Si single crystal could be measured by using 30 μm in diameter of X-ray beam.

为了测量应力强度因子范围（ΔK）沿着疲劳断口的变化，利用背反射照相机和高强度同步辐射微束X射线源（SR）对疲劳断口附近的循环塑性区进行了研究，通过成像板上Debye-Scgerrer环上出现的小斑点，表明了循环塑性区内亚晶的存在。这种效应在循环塑性区之外不存在。根据Debye-Scherrer环中的斑点数量与断裂面深度之间的关系，估计了表面以下的循环塑性区的大小。ΔK是从这个关系式中测得的。采用同步辐射X射线源，可以在合理的曝光时间内实现高位置分辨率的测量，这种微束X射线衍射技术也适用于单晶局部区域残余应力的测量，用直径为30 μm的X射线束可以测量Si单晶中的残余应力。

项目成果

鈴木裕士: "Stress Measurements in Silicon Single Crystal by Microbeam Synchrotron X-Rays"Proc.of ICRS 6. 2. 1042-1049 (2000)

Yuji Suzuki：“通过微束同步加速器 X 射线对硅单晶进行应力测量”Proc.of ICRS 6. 2. 1042-1049 (2000)

吉岡靖夫: "Study of the Fatigue Fracture Surface Regions of Steels Using Microbeam Synchrotron X-Ray Diffraction"Advances in X-Ray Analysis. 43(CD-ROM). (2000)

Yasuo Yoshioka：“利用微束同步加速器 X 射线衍射研究钢的疲劳断裂表面区域”X 射线分析进展 43（CD-ROM）。

秋田貢一: "シンクロトロン放射光によるX線フラクトグラフィ-疲労破面直下の残留応力分布-"材料. 49. 748-753 (2000)

Koichi Akita：“使用同步加速器辐射的 X 射线断口分析 - 疲劳断裂表面下方的残余应力分布 -”材料 49. 748-753 (2000)。

K.Akita: "X-Ray Fractography Using Synchrotron -Residual Stress Distribution Just Beneath Fatigue Fracture Surface-"Materia Science Research International. Vol.6. 269-274 (2000)

K.Akita：“使用同步加速器的 X 射线断口分析 - 疲劳断裂表面下方的残余应力分布 -”国际材料科学研究。

秋田貢一: "X-Ray Fractography Using Synchrotron - Residual Stress Distribution Just Beneath Fatigue Fracture Surface-"Material Science Research International. 6. 269-274 (2000)

Koichi Akita：“使用同步加速器的 X 射线断口分析 - 疲劳断裂表面下方的残余应力分布 -”国际材料科学研究。 6. 269-274 (2000)