X-RAY STRESS ANALYSIS ON SINGLE CRYSTAL BY USING IMAGING PLATE
使用成像板对单晶进行 X 射线应力分析
基本信息
- 批准号:08650122
- 负责人:
- 金额:$ 1.22万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (C)
- 财政年份:1996
- 资助国家:日本
- 起止时间:1996 至 1997
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
Stresses in a single crystal specimen or any individual grain of polycrystals specimen were measured by the use of imaging plate which is a two-dimensional x-ray detector. A problem is how to measure stresses experimentally because continuous Debye-Scherror (DS) diffraction ring in not measured but only just a spot from a grain is appeared on an imaginary DS circle from polycrystals specimen. Therefore, it is important to correct such spot to be measured lattice spacing and we adopted the imaging plate and a specimen oscillating because it is easy to obtain a measurable diffraction spot on an imaginary circle.Course grained pure iron specimens were prepared and after determination of orientation (hkl) [uvw] on each grain measured by Laue method, 211 diffractions on each grain before and after plastic deformation were measured by Cr-Kalpha x-rays. A sample stage with the phi and psi rotating attachment was oscillated upon the x-ray irradiated point on the specimen surface in RX-RY directions by use of two stepping motors to convert a measurable arc from a diffraction spot. In addition, a DS ring from annealed iron powder was also diffracted on the same imaging plate for precise determination of the distance between imaging plate and specimen.Exposure time required for a diffraction pattern was less than 3 minutes by use of the imaging plate and the lattice spacing was accurately determined by the assistance of the image processing technique. We can determine both the stress tensor from the lattice spacing before and after plastic deformation and residual stress tensor from those after plastic deformation only. Since the difference between both tensors is comparatively small, we concluded that residual stresses in a grain can be measured without the use of lattice parameters on the non-stresses condition.
单晶试样或多晶试样中的任何单个晶粒的应力是通过使用成像板(其是二维X射线探测器)来测量的。由于多晶体试样的德拜-薛尔(DS)衍射环在假想的DS圆上只出现一个颗粒的衍射点,而没有测量到连续的DS衍射环,因此如何在实验上测量应力是一个难题。因此,将这种衍射斑点校正为晶格间距是很重要的,我们采用了成像板和样品振荡,因为很容易在假想的圆上获得可测量的衍射斑点。制备粗晶粒纯铁样品,用劳厄法测定每个晶粒上的取向(hkl)[uvw]后,用Cr-K α X射线测量了塑性变形前后每个晶粒上的211个衍射。通过使用两个步进电机,使具有phi和psi旋转附件的样品台在RX-RY方向上在样品表面上的X射线照射点上振荡,以从衍射点转换可测量的弧。此外,还将退火铁粉的DS环在同一成像板上进行衍射,以精确确定成像板与试样之间的距离,利用成像板获得衍射图样所需的曝光时间小于3分钟,并借助图像处理技术精确确定晶格间距。我们既可以由塑性变形前后的点阵间距确定应力张量,也可以由塑性变形后的点阵间距确定残余应力张量。由于这两个张量之间的差异是比较小的,我们得出结论,在晶粒中的残余应力可以测量,而不使用的晶格参数的无应力条件。
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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YOSHIOKA Yasuo其他文献
YOSHIOKA Yasuo的其他文献
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