X-Ray Measurement of Stress in a Localized Area of Ceramics by Use of Imaging Plate

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We combined a modified single exposure technique and the imaging plate, which is an x-ray digital area detector, for determination of stress in a localized area. Stress value by the single exposure method is obtained from lattice strains in only two directions with a single incident x-ray beam directed at an oblique angle. However, diffraction data around a whole Debye-Scerrer ring was used in this study, and then a stress value can be accurately determined in comparison with the single exposure method. We measured the DS ring by use of the imaging plate with requiring only a short exposure time. Lattice strains in many directions on a DS ring were measured by the assistance of an image processing analyzer connected to a personal computer.