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Laser scattering measurements of electric field, electron density and electron temperature in a plasma-display discharge

等离子显示放电中电场、电子密度和电子温度的激光散射测量

基本信息

批准号：
11650350
负责人：
UCHINO Kiichiro
金额：
$ 2.18万
依托单位：
Kyushu University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
1999
资助国家：
日本
起止时间：
1999 至 2001
项目状态：
已结题

项目摘要

This research has been carried out to develop laser Thomson scattering (LTS) as a diagnostic method of micro-discharges for the plasma display panel (PDF) and to reveal the discharge structure based on profiles of electron density n_e and electron temperature T_e measured by LTS.Obtained results are as follows.1. For the application of LTS to the micro-discharge, difficulties were a very small Thomson scattering signal and the very strong stray laser. In order to overcome these difficulties, we used the photon counting method, and fabricated a special triple-grating spectrometer which had a stray light rejection of 10^8. These allowed us to perform Thomson scattering measurements of n_e and T_e in the micro-discharges.2. The LTS system developed was applied to the micro-discharge which simulated the PDF discharge. As a result, clear LTS signals were detected for the first time at 0.1 mm above the surface of the electrode substrate.3. Profiles of n_e and T_e were measured at 0.1 mm above the surface of the electrode substrate. Values of n_e and T_e were (0.2 - 3) x 10^<19> m^<-3> and (1.6 - 3.4) eV, respectively, depending on the time from the beginning of the pulsed discharge and the observation position.4. The structure of the micro-discharge is discussed in terms of the obtained distributions of n_e and T_e. We have shown that the temporal change of the T_e peak position can be related to the movement of the discharge front which is formed by the wall-charges accumulated on the dielectric surface of the electrode substrate.

本研究将激光汤姆逊散射（LTS）作为等离子体显示器（PDP）微放电的诊断方法，并根据LTS测量的电子密度n_e和电子温度T_e的分布来揭示放电结构，取得了如下结果.对于LTS在微放电中的应用，难点在于汤姆逊散射信号很小，杂散激光很强。为了克服这些困难，我们采用光子计数的方法，制作了一种特殊的三光栅光谱仪，其杂散光抑制率为10^8。这使我们能够进行汤姆逊散射测量的n_e和T_e的微放电。将研制的LTS系统应用于微放电实验，模拟了PDF放电。结果，首次在电极基板表面上方0.1mm处检测到清晰的LTS信号。在电极基底表面以上0.1mm处测量了n_e和T_e的分布。n_e和T_e的值分别为（0.2 - 3）× 10 ~<19><-3>（-3）m ~ 2和（1.6 - 3.4）eV，这取决于从脉冲放电开始的时间和观察位置。根据n_e和T_e的分布讨论了微放电的结构。我们指出，T_e峰值位置的时间变化与电极基片介质表面上积累的壁电荷形成的放电前沿的移动有关。