Thermal imaging with ultrafine spatial resolution in the scanning electron microscope

扫描电子显微镜中具有超精细空间分辨率的热成像

• 批准号: 2020842
• 负责人: Chris Dames
• 金额: $ 41.66万
• 依托单位: University of California-Berkeley
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2020
• 资助国家: 美国
• 起止时间: 2020-07-01 至 2023-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=2020842&HistoricalAwards=false
• 关键词: Thermal; imaging; ultrafine; spatial; resolution

From cell phones to laptops to the internet of things, the defining trend of modern microelectronics is the relentless drive towards packing more processing power in smaller areas. A corollary is that the heat dissipation per unit area also increases exponentially, posing serious challenges in thermal management to keep the devices from overheating. Some cutting-edge technologies exploit nanoscale thermal phenomena such as heat-assisted magnetic recording and resistive random access memory, which rely on precise heat generation and dissipation at extraordinarily small length scales of ~10 nm and below. Clearly the rational design of such advanced nanoscale devices requires measuring their temperatures, yet direct experimental measurement of temperature at such small length scales remains extraordinarily challenging. An ideal measurement technique would have spatial resolution of 10 nm or less, operate without physical contact to the sample, work on many materials, and use widely available hardware. Developing such a measurement technique is the overarching vision of this project.Building on a preliminary proof-of-concept study, the goal of this project is to develop a novel scanning electron microscopy thermometry technique into a robust tool for temperature mapping. The team focuses on the ubiquitous secondary electron signal, which is already the standard for ultrahigh resolution (~1 - 10 nm) mapping of structure and geometry. The proposal envisions three major thrusts: (i) Experimentally clarify the underlying physics of how temperature affects the secondary electron signal. (ii) Rigorously measure and understand the limiting resolutions of this technique, in temperature, space, and time. (iii) Demonstrate the usefulness of this new experimental tool for innovative studies of nanoscale thermal phenomena as well as applications in device characterization. The intellectual merit of this project is firstly in developing scanning electron microscopy thermometry into a robust, practical tool for temperature mapping with ~10 nm spatial resolution, using signals and hardware which are widely available. Another contribution will be bringing concepts for rigorously quantifying spatial resolution from optics into the thermal community, specifically the thermal point spread function. Finally, the team will apply the tool to pursue the first ever direct observations of ballistic phenomena such as temperature reversal and localization via mapping their full temperature fields.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

从手机到笔记本电脑再到物联网，现代微电子的决定性趋势是在更小的区域内封装更多的处理能力。一个必然的结果是，单位面积的散热也呈指数级增长，这对热管理提出了严峻的挑战，以防止设备过热。一些尖端技术利用纳米级热现象，例如热辅助磁记录和阻性随机存取存储器，它们依赖于~10纳米及以下的极小长度尺度上的精确发热和散热。 显然，这种先进的纳米器件的合理设计需要测量它们的温度，但在如此小的长度尺度上直接实验测量温度仍然非常具有挑战性。 理想的测量技术应具有10 nm或更小的空间分辨率，在不与样品物理接触的情况下操作，适用于许多材料，并使用广泛可用的硬件。 开发这样一种测量技术是该项目的总体愿景。在初步概念验证研究的基础上，该项目的目标是开发一种新的扫描电子显微镜测温技术，使其成为温度测绘的强大工具。该团队专注于无处不在的二次电子信号，这已经是结构和几何结构的高分辨率（~1 - 10 nm）映射的标准。 该提案设想了三个主要目标：（i）通过实验阐明温度如何影响二次电子信号的基本物理学。 (ii)严格测量和理解这种技术在温度、空间和时间方面的极限分辨率。 (iii)展示这种新的实验工具在纳米级热现象的创新研究以及在器件表征中的应用方面的实用性。 该项目的智力价值首先是将扫描电子显微镜测温技术发展成为一种强大的实用工具，用于使用广泛可用的信号和硬件进行~10 nm空间分辨率的温度映射。 另一个贡献将是将严格量化光学空间分辨率的概念引入热社区，特别是热点扩散函数。 最后，该团队将应用该工具，通过绘制完整的温度场，对弹道现象进行首次直接观测，如温度反转和局部化。该奖项反映了NSF的法定使命，并通过使用基金会的知识价值和更广泛的影响审查标准进行评估，被认为值得支持。