Chemical reaction control in nano-area by radiation -transformation of radiation physics to radiation chemistry -

辐射控制纳米区域化学反应-辐射物理向辐射化学的转化-

基本信息

  • 批准号:
    13358008
  • 负责人:
  • 金额:
    $ 27.21万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
  • 财政年份:
    2001
  • 资助国家:
    日本
  • 起止时间:
    2001 至 2003
  • 项目状态:
    已结题

项目摘要

(1) New in situ analysis methods to study materials modification near surface regions brought by ion implantation were developed utilizing various radiation like electrons, ions, laser photons, as a probe.(2) Applying EXELFS and EELS, developed by this study, damage process of graphite was examined. It is clearly demonstrated that some new type of bonding different from sp^2 accompanying flouren type structure formation in both electron-and ion-irradiation.(3) Glazing incidence electron microscopy was also developed and successfully applied for the surface modification like a blister formation. A new blistering mechanism was proposed for covalent and semiconductor materials based on ductile transformation.(4) Molecular dynamic approach was applied to examine the swelling of SiC by ion irradiation and probed to be very effective. It was found that in SiC, an additional mechanism i.e. changes of bond length between Si-Si and Si-C atoms and bond angles of Si-C-Si is contributing the swelling in addition to the void swelling.(5) The nano-identation method was also applied to examine change of surface mechanical properties by ion implantation and the material strength in nanometer thickness was successfully extracted.(6) Appling various simulation codes, energy conversion or damaging process in nano-range was extensively studied. It was found that electron excitation play very important role in damaging process of covalent and semiconductor materials.(7) Energy conversion of γ-ray through production of secondary electrons and photons was successfully demonstrated. A new electric cell driven by γ-ray source was developed.
(1)利用电子、离子、激光光子等各种辐射作为探针,发展了研究离子注入材料近表面改性的原位分析新方法。(2)应用本研究开发的EXELFS和EELS,研究了石墨的损伤过程。结果表明,在电子和离子辐照下,伴随着芴类结构的形成,出现了一些不同于sp^2的新型成键。(3)玻璃入射电子显微镜也被开发并成功地应用于表面改性,如水泡的形成。提出了一种新的基于韧性相变的共价键和半导体材料的起泡机理。(4)用分子动力学方法研究了离子辐照对SiC的溶胀作用,发现该方法是有效的。结果表明,在SiC中,除了空洞膨胀外,Si-Si和Si-C原子间键长和Si-C-Si键角的变化也是导致膨胀的另一个机制。(5)采用纳米压痕法检测了离子注入对材料表面力学性能的影响,成功地提取了纳米厚度下的材料强度。(6)应用各种模拟程序,对纳米尺度下的能量转换或损伤过程进行了广泛的研究。发现电子激发在共价键材料和半导体材料的损伤过程中起着非常重要的作用。(7)成功地证明了γ射线通过产生二次电子和光子的能量转换。研制了一种新型的γ射线源驱动电池。

项目成果

期刊论文数量(39)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
S.Muto, S.Dhara, A.Datta, et al.: "Characterization of nanodome on GaN nanowires formed with Ga ion irradiation, Materials Transactions"Materials Transactions. Vol.45(2). 1-5 (2004)
S.Muto、S.Dhara、A.Datta 等人:“用 Ga 离子辐照形成的 GaN 纳米线上的纳米圆顶的表征,材料学报”材料学报。
  • DOI:
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  • 影响因子:
    0
  • 作者:
  • 通讯作者:
T.Sawasaki, T.Tanabe, T.Yoshida, R.Ishida: "The application of gamma radiolysis of water for H_2 production"Journal of Radioanalytical and Nuclear Chemistry. Vol.255. 271-274 (2003)
T.Sawasaki、T.Tanabe、T.Yoshida、R.Ishida:“水的伽马辐射分解用于 H_2 生产的应用”放射分析与核化学杂志。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
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五十嵐慎一, 武藤俊介, 田辺哲朗: "低角度入射電子顕微鏡法による表面微小構造体の非破壊分析"日本金属学会誌(2001)pp.423-426. 65巻,5号. 423-426 (2001)
Shinichi Igarashi、Shunsuke Muto、Tetsuro Tanabe:“通过低角度入射电子显微镜对表面微观结构进行非破坏性分析”日本金属学会杂志(2001)第 423-426 页,第 5. 423 卷。 -426 (2001))
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
S.Muto, H.Sugiyama, T.Kimura, T.Tanabe: "Structure of an Oxygen-Related Defect Complex in SiC Studied with Electron Energy-Loss Spectroscopy"Japanese Journal of Applied Physics. 43(3)(in press). (2004)
S.Muto、H.Sugiyama、T.Kimura、T.Tanabe:“用电子能量损失光谱研究碳化硅中与氧相关的缺陷复合体的结构”日本应用物理学杂志。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
T.Yoshida, T.Tanabe, M.Hirano, S.Muto: "FT-IR Study on the effect of OH content on the damaging process in silicon irradiated by hydrogen"Nucl.Instr.Methods B. (in press). (2004)
T.Yoshida、T.Tanabe、M.Hirano、S.Muto:“OH 含量对氢辐照硅损伤过程影响的 FT-IR 研究”Nucl.Instr.Methods B.(出版中)。
  • DOI:
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    0
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TANABE Tetsuo其他文献

TANABE Tetsuo的其他文献

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{{ truncateString('TANABE Tetsuo', 18)}}的其他基金

Tritium retention and erosion/deposition of first wall materials
第一壁材料的氚保留和侵蚀/沉积
  • 批准号:
    17206092
  • 财政年份:
    2005
  • 资助金额:
    $ 27.21万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Hydrogen recycling and tritiurn retention at plasma facing wall in a fusion reactor
聚变反应堆等离子体面壁处的氢气回收和氚保留
  • 批准号:
    13480134
  • 财政年份:
    2001
  • 资助金额:
    $ 27.21万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Appliocation of High Z materials as Plasma Facing Materials
高Z材料作为等离子体表面材料的应用
  • 批准号:
    10308020
  • 财政年份:
    1998
  • 资助金额:
    $ 27.21万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A).
Dynamic Effect of Neutron Irradiation in Damaging process of Ceramics and Glasses
中子辐照在陶瓷和玻璃损伤过程中的动态效应
  • 批准号:
    07558284
  • 财政年份:
    1995
  • 资助金额:
    $ 27.21万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Characteristics of High Z Materials as A plasma Facing Material
高 Z 材料作为等离子体表面材料的特性
  • 批准号:
    05452395
  • 财政年份:
    1993
  • 资助金额:
    $ 27.21万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
Dynamic Process of Hydrogen Recycling at First Wall
第一壁氢气回收动态过程
  • 批准号:
    03452303
  • 财政年份:
    1991
  • 资助金额:
    $ 27.21万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)

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  • 批准号:
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    20H04453
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    2020
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用于电子能量损失光谱和零损失滤波叠层记录术的高灵敏度电子探测器
  • 批准号:
    447894364
  • 财政年份:
    2020
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Electron energy-loss spectroscopy on three dimensional plasmonic nanostructures
三维等离子体纳米结构的电子能量损失谱
  • 批准号:
    289570250
  • 财政年份:
    2016
  • 资助金额:
    $ 27.21万
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Structure analysis of lattice defects in near bulk specimens combining high-voltage electron microscopy and electron energy loss spectroscopy.
结合高压电子显微镜和电子能量损失光谱对近块体样品中的晶格缺陷进行结构分析。
  • 批准号:
    22246090
  • 财政年份:
    2010
  • 资助金额:
    $ 27.21万
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    Grant-in-Aid for Scientific Research (A)
Electron Energy Loss Spectroscopy of individual Ions implanted into Carbon Nanostructures
植入碳纳米结构中的单个离子的电子能量损失谱
  • 批准号:
    EP/F06604X/1
  • 财政年份:
    2008
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Local state analysis of organic semiconductor thin films by spatially and angular resolved electron energy-loss spectroscopy
通过空间和角分辨电子能量损失光谱对有机半导体薄膜进行局域态分析
  • 批准号:
    15310089
  • 财政年份:
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使用内壳电子能量损失光谱通过通道增强微分析进行原子定位
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    DP0209221
  • 财政年份:
    2002
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    $ 27.21万
  • 项目类别:
    Discovery Projects
Atom Location by Channelling Enhanced Microanalysis using Inner-shell Electron Energy Loss Spectroscopy
使用内壳电子能量损失光谱通过通道增强微分析进行原子定位
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