Reliability Assurance System Using Large Scale Multi-Media Databases and its Application

大规模多媒体数据库可靠性保障系统及其应用

• 批准号: 13680515
• 负责人: SUZUKI Kazuyuki
• 金额: $ 2.11万
• 依托单位: University of Electro-Communications
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2001
• 资助国家: 日本
• 起止时间: 2001 至 2003
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-13680515/
• 关键词: Reliability; Data Base; Safety; Human error; Condition Monitoring Maintenance; Data Mining; Warranty Data; Lifetime Data

Results are summarized into the following four categories :1.System for Sharing Information to Prevent Reliability and Safety ProblemsTo prevent problems in reliability and safety, collection and analysis of data, integration of information through databases, and their application on the actual spot play important roles. Researches on management aspect, human aspect and hardware aspect are implemented and systems for sharing information for reliability and safety are proposed.2.Design of Lifetime Evaluation and Its Distributional FormAn optimal design for binary lifetime experiment is developed which attains the highest precision of the estimation from D-optimal criterion. Also its sequential design is investigated. It becomes clear that the distributional form of an electro-migration of LSI follows a log-normal distribution, not Weibull distribution.3.Condition Monitoring Maintenance Aiming Utilization of Multi-media InformationCondition monitoring maintenance using sensors plays impo … More rtant roles for reliability and safety assurance. But a sensor has two failure modes : false alarm and failure to alarm. To decrease these failures, a k-out-of-n alarm decision system prevails. This research investigates the optimality of equal thresholds of all sensors for alarming, validity of self-moving sensors, and the thresholds with gray zone areas.4.Lifetime Data Analysis Based on Large Scale DatabasesNowadays databases of field reliability data have been spreading all over the world and getting larger and larger. Mainly these data come from repair records during product warranty period in each division. To the contrary, sales amount information comes from the databases of sales department. It is necessary to combine these two different databases for estimating lifetime parameters. It is necessary to combine these two different databases fro estimating lifetime parameters. Also, sometimes, sales amount of each month is missing and just total sales amount of the products are known. This research tackles with those problems and develops the methods of lifetime data based on large scale databases. Less

结果归纳为以下四类：1.预防可靠性和安全性问题的信息共享系统为了预防可靠性和安全性问题，收集和分析数据，通过数据库整合信息，并将其应用于实际现场发挥重要作用。从管理、人和硬件三个方面进行了研究，提出了可靠性和安全性信息共享系统。2.寿命评估及其分布形式设计提出了二元寿命试验的最优设计，使D-最优准则的估计精度达到最高。并对其序贯设计进行了研究。结果表明，LSI的电迁移分布服从对数正态分布，而不是威布尔分布。3.状态监测维修的目的多媒体信息的利用利用传感器的状态监测维修在LSI的状态监测维修中具有重要意义 ...更多信息 可靠性和安全保证的重要作用。但传感器有两种故障模式：误报和未报警。为了减少这些故障，一个k-out-of-n报警决策系统盛行。研究了传感器报警阈值相等的最优性、传感器自移的有效性以及带有灰色区域的阈值。4.基于大规模数据库的寿命数据分析目前，现场可靠性数据库遍布全球，规模越来越大。这些数据主要来源于各事业部产品保修期内的维修记录。相反，销售额信息来自销售部门的数据库。有必要将这两个不同的数据库联合收割机来估计寿命参数。为了估计寿命参数，有必要将这两个不同的数据库联合收割机。此外，有时，每个月的销售额是缺失的，并且仅知道产品的总销售额。本研究正是针对这些问题，提出了基于大规模数据库的寿命数据处理方法。少

项目成果

Karim, M.R., Suzuki, K.: "Analysis of Marginal Count Failure Data by using Covariates"International Journal of Reliability and Application. Vol.4. 79-95 (2003)

Karim, M.R.、Suzuki, K.：“使用协变量分析边际计数故障数据”国际可靠性与应用杂志。

鈴木 和幸, 田中 健次, 伊藤 誠: "品質危機とヒューマンファクター"品質管理. Vol.52. 812-824 (2001)

Kazuyuki Suzuki、Kenji Tanaka、Makoto Ito：“质量危机与人为因素”质量管理第 52 卷（2001 年）。

L.-H.Wang, K.Suzuki, W.Yamamoto: "Age-Based Warranty Data Analysis Without Date-Specific Sales Information"Journal of Applied Stochastic Models in Business and Industry. Vol.18. 323-337 (2002)

L.-H.Wang、K.Suzuki、W.Yamamoto：“基于年龄的保修数据分析，没有特定日期的销售信息”商业和工业应用随机模型杂志。

W.Yamamoto, K.Suzuki: "A Data Mining Approach to LSI Manufacturing System"The 2002 Taipei International Statistical Symposium and Bernoulli Society EAPR Conference. (2002)

W.Yamamoto、K.Suzuki：“A Data Mining Approach to LSI Manufacturing System”2002年台北国际统计研讨会暨伯努利学会EAPR会议。

Yamamoto, W., Suzuki, K.: "An Analysis of Defect Patterns of Semiconductor Wafers"The 2nd International Symposium on Business and Industrial Statistics. 157-160 (2001)

Yamamoto, W.，Suzuki, K.：“半导体晶圆缺陷模式分析”第二届商业和工业统计国际研讨会。