A study on high quality field test for VLSIs

本工作的目的是建立一种利用系统空闲时间对逻辑电路进行高质量现场测试的方法。特别是该方法具有对老化故障的检测能力。现场测试通常需要较短的测试应用时间和较小的内存空间，而测试机会不止一次。本文提出了一种测试划分和旋转测试方法，对给定的测试模式集进行划分，通过多个测试机会实现一个完整的测试。

The purpose of this work is to establish a high quality field test method using system-idle time for logic circuits. Especially the method has an ability of detection for aging-induced faults. In general, field test requires short test application time and small memory space while test opportunity is more than once. In this work, a test partitioning and rotating test method is developed in which a given test pattern set is partitioned and a whole test is achieved through multiple test opportunity.