Development of polarization-free CdTe radiation detector

本研究是对肖特基型CdTe辐射探测器极化现象的改进。以铝、钛和镍为肖特基电极，制备了Al/CdTe/Pt、Ti/CdTe/Pt和Ni/CdTe/Pt肖特基二极管。与商用In/CdTe/Pt二极管相比，这些二极管均表现出优良的电学性能和高质量的g射线辐射探测性能。对CdTe表面进行硫处理后，极化现象得到明显改善，实现了对γ射线辐射的长时间（约1d）测量。此外，我们还研究了CdTe辐射探测器的钝化膜。非晶碳膜具有良好的电性能（高电阻率和低介电常数），可作为CdTe辐射探测器的绝缘钝化膜。

This research is the improvement of the polarization phenomenon for the Schottky type CdTe radiation detector. Aluminum, titanium and nickel were used for the Schottky electrode for the CdTe; and the Al/CdTe/Pt, Ti/CdTe/Pt, and Ni/CdTe/Pt Schottky diodes were fabricated. All these diodes showed the excellent electrical property and the high quality of g-ray radiation detection compared with the commercial In/CdTe/Pt diode. Polarization phenomenon was drastically improved by the sulfur treatment of CdTe surface, and the long-time measurement (about 1day) of γ-ray radiation was achieved. Furthermore, we investigated the passivation film for CdTe radiation detector. Amorphous carbon films showed enough electrical properties (high electrical resistivity and low permittivity) for the insulation between electrodes, and that is a promising candidate of the insulative passivation film for CdTe radiation detector.