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A Study on education system for packaging reliability of next generation Sic power device.

A Study on education system for packaging reliability of next generation Sic power device.
下一代碳化硅功率器件封装可靠性教育体系研究
批准号:
22360047
负责人:
YU Qiang
金额:
$12.06万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2010
资助国家:
日本
项目状态:
已结题
起止时间:
2010 至 2012

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中文摘要
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英文摘要
A new evaluation system for next generation SiC power device was established. The new experimental measurement method and the reliability evaluation approach have been proposed for the new Ag nano joints. And a new simulation system considering the fatigue process has been developed to assess the reliability behavior of the power modules.
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会议论文
DOI: --
发表时间: 2011
期刊:
影响因子: --
作者: [Sato Hiroyuki, Qiang Yu, Sone Ryusuke]
通讯作者: Sone Ryusuke
Toshikazu Oshidari, Hiromi Sugihara, A Study on Reliability of High-Temperature Joint in Pack aging Structure
Toshikazu Oshidari、Hiromi Sugihara,封装结构高温接头可靠性研究
DOI: --
发表时间: 2011
期刊:
影响因子: --
作者: [Takayuki lshikawa, Qiang Yu]
通讯作者: Qiang Yu
DOI: --
发表时间: 2012
期刊:
影响因子: --
作者: [Yasutaka Yamada, Qiang Yu, Tomohiro, Takahashi, Yusuke Takagi]
通讯作者: Yusuke Takagi
DOI: --
发表时间: 2010
期刊:
影响因子: --
作者: [H.AKAEDA, Q.Yu]
通讯作者: Q.Yu
33
    Advanced Assessment Methodology of Lead-free Solder Joints under Multi-loads in Three-dimensional Electronic Packaging
    • 批准号:
      18360056
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $10.14万
    • 财政年份:
      2006
    • 负责人:
      YU Qiang
    • 依托单位:
    Integrated Reliability Evaluation and Design for Advanced 3D Electronics Packaging
    • 批准号:
      15360048
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $9.79万
    • 财政年份:
      2003
    • 负责人:
      YU Qiang
    • 依托单位:
    海外基金