Nanometer cale surface charge mapping in liquids

液体中纳米级表面电荷映射

• 批准号: 22686007
• 负责人: KOBAYASHI Kei
• 金额: $ 15.89万
• 依托单位: Kyoto University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Young Scientists (A)
• 财政年份: 2010
• 资助国家: 日本
• 起止时间: 2010 至 2012
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-22686007/
• 关键词: 走査プローブ顕微鏡; 原子間力顕微鏡; カンチレバー; 溶液環境

A surface charge mapping technique based on frequency modulation atomic force microscopy (FM-AFM) working in liquid environments has been developed. We implemented a phototheimal excitation setup for cantilever oscillation in liquids to perform quantitative force measurements. We analyzed the cantilever oscillation caused by an external modulation voltage between the tip and sample surface, and found that the conventional voltage modulation schemes for surface potential measurement cannot be applied in polar liquids. We also developed a method to estimate surface charge density by comparing measured electrostatic force with theoretically calculated force.

发展了一种基于调频原子力显微镜（FM-AFM）的液体环境表面电荷成像技术。我们实现了一个phototherapy激励设置悬臂梁振荡液体进行定量力的测量。我们分析了探针和样品表面之间的外部调制电压引起的悬臂梁振荡，发现用于表面电位测量的常规电压调制方案不能应用于极性液体。我们还开发了一种方法，通过比较测量的静电力与理论计算的力来估计表面电荷密度。

项目成果

Development of High-Resolution Imaging of Solid–Liquid Interface by Frequency Modulation Atomic Force Microscopy

调频原子力显微镜固液界面高分辨率成像的发展

• DOI: 10.1143/jjap.49.08lb12
• 发表时间: 2010
• 期刊: Japanese Journal of Applied Physics
• 影响因子: 1.5
• 作者: Katsuyuki Suzuki;S. Kitamura;Shukichi Tanaka;K. Kobayashi;Hirofumi Yamada
• 通讯作者: Hirofumi Yamada

原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡

原子力显微镜中的悬臂激发方法及原子力显微镜

• 发表时间: 2011

原子間力顕微鏡を用いた誘電特性測定方法

使用原子力显微镜测量介电特性的方法

• 发表时间: 2011

Aqueous Solution Structure over α-Al2O3(011̅2) Probed by Frequency-Modulation Atomic Force Microscopy

• DOI: 10.1021/jp1057447
• 发表时间: 2010-11
• 期刊: Journal of Physical Chemistry C
• 影响因子: 3.7
• 作者: Takumi Hiasa;K. Kimura;H. Onishi;M. Ohta;Kazuyuki Watanabe;Ryohei Kokawa;N. Oyabu;K. Kobayashi;Hirofumi Yamada

High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method

• DOI: 10.1143/apex.3.065205
• 发表时间: 2010-01-01
• 期刊: APPLIED PHYSICS EXPRESS
• 影响因子: 2.3
• 作者: Umeda, Ken-ichi;Oyabu, Noriaki;Yamada, Hirofumi
• 通讯作者: Yamada, Hirofumi