Creep-Fatigue Life Estimation for Nickel Base Single Crystal Superalloy under Multiaxial Loading

多轴加载下镍基单晶高温合金的蠕变疲劳寿命估算

• 批准号: 23560105
• 负责人: SAKANE Masao
• 金额: $ 3.49万
• 依托单位: Ritsumeikan University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2011
• 资助国家: 日本
• 起止时间: 2011 至 2013
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-23560105/
• 关键词: 高温; 低サイクル; 疲労; 多軸; 超合金

The objective of this research is to develop a creep-fatigue life estimation method of nickel base single crystal superalloy for power generation gas turbines. Tension-torsion creep-fatigue tests using hollow cylinder specimens and biaxial tension-compression creep-fatigue tests using cruciform specimens were performed at 900C. Mises equivalent stress correlated the multiaxial low cycle fatigue lives and the equivalent stress modified by testing frequency correlated the creep-fatigue lives within a small scatter band.

本研究旨在建立发电燃气轮机用镍基单晶高温合金蠕变疲劳寿命估算方法。在900℃下进行了中空圆筒拉伸-扭转蠕变-疲劳试验和十字形拉伸-压缩蠕变-疲劳试验。MISES等效应力与多轴低周疲劳寿命相关，经试验频率修正的等效应力与蠕变-疲劳寿命在一个较小的分散带内相关。

项目成果

Thermo-Mechanical Fatigue Life of Solder Alloys

焊料合金的热机械疲劳寿命

• 作者: Noritake Hiyoshi，Takamoto Itoh，Masao Sakane

4種類の電子デバイス用樹脂薄膜のクリープ強度比較

四种电子器件用树脂薄膜的蠕变强度比较

• 作者: K.Suga;K.Miyazaki;S.Kawasaki;Y.Arai;M.Kikuchi;西籔和明,田邉大貴,鹿子泰宏,田中茂雄;藤岡健太，金山英幸，坂根政男，小林馨
• 通讯作者: 藤岡健太，金山英幸，坂根政男，小林馨

Factual Database on Tensile, Creep, Low Cycle Fatigue and Creep-fatigue of Lead and Lead-free Solders Vol. I～IV

铅和无铅焊料的拉伸、蠕变、低周疲劳和蠕变疲劳事实数据库卷 I～IV。

• 发表时间: 2013
• 作者: Masao Sakane（主査）;Isamu Nonaka;Takamoto Itoh;Noritake Hiyoshi;Mineo Nozaki;Akira Ueno;Takaei Yamamoto;Shengde Zhang
• 通讯作者: Shengde Zhang

Development of Miniature Creep Testing for High Temperature Materials-Development of Testing Machine

高温材料微型蠕变试验的研制-试验机的研制

• 发表时间: 2012
• 作者: Norio Teshima;Masahiro Goto;Seung-zeon Han;Kwangjun Euh;Terutoshi Yakushiji;本田武志,倉前宏行,森本秀夫,森田有亮,仲町英治;Masao Sakane,Yusuke Kitamura,Takamoto Itoh,Yuichi Irisawa,Takafumi Tsurui,Masaharu Fujiwara,Taejoon Kim
• 通讯作者: Masao Sakane,Yusuke Kitamura,Takamoto Itoh,Yuichi Irisawa,Takafumi Tsurui,Masaharu Fujiwara,Taejoon Kim

Low Cycle Fatigue Crack Initiation and Propagation Behavior of Copper Thin Films Used in Electronic Devices

电子器件用铜薄膜的低周疲劳裂纹萌生和扩展行为

• 作者: Tasuku Kambayashi;Masao Sakane and Kenji Hirohata
• 通讯作者: Masao Sakane and Kenji Hirohata