Development of x-ray standing waves for visualizing an atomic-scale interface of electronic materials and devices
Development of x-ray standing waves for visualizing an atomic-scale interface of electronic materials and devices
批准号:
23600018
负责人:
SAKATA Osami
金额:
$3.49万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2011
资助国家:
日本
项目状态:
已结题
起止时间:
2011 至 2013
中文摘要
我们开发了一种x射线光学系统,包括一个或两个Si(004)通道切割晶体,用于稳定弧秒角发散的反馈控制系统,折射微米透镜和限制狭缝。当入射12.4 keV的x射线光子时,垂直角散度为1.3弧秒,水平光束尺寸约为2微米。我们研究了在H2SO4溶液中的金单晶表面和在蓝宝石单晶上外延生长的薄膜和纳米线。观察了衍射强度和发射曲线的摇摆曲线。这些曲线看起来像一个几乎完美晶体的动态x射线衍射曲线。在金和蓝宝石衬底上发生了动态x射线衍射现象,这是非常令人惊讶和意想不到的。我们的研究结果表明,可以将驻波技术应用于非完美晶体(如金属和氧化物材料)表面系统和薄膜埋藏界面的结构分析。
英文摘要
We developed an x-ray optics including one or two Si (004) channel-cut crystals, a feedback-control system for stabilizing an arc-sec angular divergence, refractive micrometer lenses, and limiting slits. A vertical angular divergence of 1.3 arc sec and a horizontal beam size of about 2 um were evaluated for 12.4 keV incident x-ray photons.We investigated a gold single crystal surface in H2SO4 solution and a thin film and nanowires epitaxially grown on a sapphire single crystal. Rocking curves of diffraction intensities and emission profiles were observed. The curves look like dynamical x-ray diffraction ones for an almost perfect crystal. Dynamical x-ray diffraction phenomena took place in the gold and sapphire substrate, which was quite surprising and unexpected.Our research outcomes indicate that one will apply the standing wave technique to a structural analysis for a surface system and buried interface of thin film on a non perfect crystal like a metal and oxide material.
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会议论文
X線回折法で表界面・薄膜・ナノ構造で何が分かるか/ Surface, thin film, and nano structural information obtained using x-ray diffraction
使用 X 射线衍射获得表面、薄膜和纳米结构信息
DOI:
--
发表时间:
2012
期刊:
日本結晶学会誌
影响因子:
--
作者:
[G. Purohit, Prithvi Singh, Vinod Patidar, Y. Azuma, and K. K. Sud, Yoshiro AZUMA, 坂田修身]
通讯作者:
坂田修身
X線回折法で表界面・薄膜・ナノ構造で何が分かるか / Surface, thin film, and nano structural information obtained using x-ray diffraction
使用 X 射线衍射获得表面、薄膜和纳米结构信息
DOI:
--
发表时间:
2012
期刊:
JOURNAL OF THE SURFACE SCIENCE SOCIETY OF JAPAN
影响因子:
--
作者:
[G. Purohit, Prithvi Singh, Vinod Patidar, Y. Azuma, and K. K. Sud, Yoshiro AZUMA, 坂田修身, 坂田修身]
通讯作者:
坂田修身
ふつうの結晶性基板との界面の構造解析に硬X線定在波法を適用する試み
硬X射线驻波法应用于普通晶体基体界面结构分析的尝试
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[坂田修身, 今井康彦, 中村将志]
通讯作者:
中村将志
Time-resolved x-ray standing waves of ferroelectric ultra-thin film for a polarization measurement
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批准号:20510113
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$3.0万
-
财政年份:2008
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负责人:SAKATA Osami
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依托单位:
Time resolved and in-situ structural analysis of a ferroelectric thin film during polarization switching using synchrotron-based diffraction
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批准号:18310085
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$8.31万
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财政年份:2006
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负责人:SAKATA Osami
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依托单位:
Development and application of a rapid analysis method of a nanostructure by direct observation of a reciprocal-lattice space using synchrotron diffraction
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批准号:16510096
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.05万
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财政年份:2004
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负责人:SAKATA Osami
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依托单位: