Development and application of a rapid analysis method of a nanostructure by direct observation of a reciprocal-lattice space using synchrotron diffraction

利用同步加速器衍射直接观察倒晶格空间的纳米结构快速分析方法的开发和应用

• 批准号: 16510096
• 负责人: SAKATA Osami
• 金额: $ 2.05万
• 依托单位: Japan Synchrotron Radiation Research Institute
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2004
• 资助国家: 日本
• 起止时间: 2004 至 2005
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-16510096/
• 关键词: Rapid diffraction method; Nanowire; Nanometer scale structure; Ultrathin film; Super-high-sensitive x-ray method; Atomic wire; Monochromatic high energy x-rays; Reciprocal-lattice space imaging; 超高感度ナノ計測回折法; 新構造解析法; ナノ結晶体の迅速構造解析法; X線逆格子空間イメージング

We developed a nondestructive analysis method for quickly characterizing a crystalline nanostructure and applied it to structural analysis of 1D and 2D nanometer scale materials. The method, which was named "obvious-at-a-glance" x-ray method, required monochromatic high-energy x-rays in grazing incidence and an x-ray 2D detector. The basic idea behind the method is that Bragg conditions of such 1D structures are sheet shapes and get loose. The method has allowed a direct reciprocal-lattice space mapping of the x-ray intensities scattered from the ID and 2D and bears characteristics of super-high-sensitivity.(1)Using this method, the sheet-shape diffraction emanating from ultrathin NiO wires was observed. The average nanowire-nanowire distance of 46 nm and a crystallographic domain size of approximately 15 nm across the nanowire were evaluated.(2)We demonstrate, using x-ray diffraction, that we have taken one-dimensional Bi nanolines (atomic wires) fabricated on a Si(001) surface, and buried them in crystalline silicon while retaining both their one-dimensional characters and important aspects of their structure. In particular, after burial, the nanolines retain the two-by periodicity associated with their surface structure along their length. We have used density functional theory calculations to model a structure for these buried nanolines, whose minimum length can be estimated to be 100 nm from the coherence length of the x-ray measurements.(3)50-nm- and 3-nm-thick Bi_4Ti_3O_<12> ferroelectric films grown on TiO_2 crystals were investigated using the method. It was determined that the thin films were monoclinic crystals.

我们开发了一种快速表征晶体纳米结构的无损分析方法，并将其应用于1D和2D纳米尺度材料的结构分析。该方法被命名为“一目了然”X射线方法，需要掠入射的单色高能X射线和X射线2D探测器。该方法背后的基本思想是，这种一维结构的布拉格条件是片状的，并且变得松散。该方法允许从ID和2D散射的X射线强度的直接倒易晶格空间映射，并且具有超高灵敏度的特征。（1）用这种方法观察到了Ni-NiO线的片状衍射。评估了46 nm的平均纳米线-纳米线距离和横跨纳米线的约15 nm的结晶学域尺寸。(2)We使用X射线衍射证明，我们已经在Si（001）表面上制造了一维Bi纳米线（原子线），并将它们埋在晶体硅中，同时保留它们的一维特征和它们结构的重要方面。特别地，在掩埋之后，纳米线沿着其长度沿着保持与其表面结构相关联的二倍周期性。我们已经使用密度泛函理论计算来模拟这些掩埋纳米线的结构，其最小长度可以从X射线测量的相干长度估计为100 nm。（3）用该方法在TiO_2晶体上生长了厚度为50 nm和3 nm的<12>Bi_4Ti_3O_2铁电薄膜。确定薄膜为单斜晶体。

项目成果

Encapsulation of atomic-scale Bi wires in epitaxial silicon without loss of structure

将原子级 Bi 线封装在外延硅中而不损失结构

• 发表时间: 2005
• 期刊: Phys. Rev. B(Rapid Communication) 72
• 作者: O.Sakata;W.Yashiro;D.R.Bowler;a.Kitano;K.Sakamoto;K.Miki
• 通讯作者: K.Miki

Reciprocal -lattice space imaging of x-ray intensities diffracted from nanowires

纳米线衍射 X 射线强度的倒易晶格空间成像

• 发表时间: 2005
• 期刊: Material Research Society Proceedings 840
• 作者: O.Sakata;A.Kitano;W.Yashiro;K.Sakamoto;K.Miki;A.Matsuda;W.Hara;S.Akiba;M.Yoshimoto
• 通讯作者: M.Yoshimoto

High-energy x-ray scattering in grazing incidence from nanometer-scale oxide wires

纳米级氧化物线掠入射中的高能 X 射线散射

• 发表时间: 2004
• 期刊: Appl. Phys. Lett. 84
• 作者: O.Sakata;M.Takata;H.Suematsu;A.Matsuda;S.Akida;A.Sasaki;M.Yoshimoto
• 通讯作者: M.Yoshimoto

特許

专利

• 发表时间: 2008

High-quality MgB_2 thin-film growth at a low temperature using an in-plane-lattice near-matched epitaxial-buffer layer

使用面内晶格近匹配外延缓冲层在低温下生长高质量 MgB_2 薄膜

• 发表时间: 2004
• 期刊: Journal of Applied Physics 96
• 作者: O.Sakata;S.Kumura;M.Takata;S.Yata;T.Kato;K.Yamanaka;Y.Yamada;A.Matsushita;S.Kubo
• 通讯作者: S.Kubo