A triple beam microscope: new frontiers in materials nanocharacterisation

该项目旨在建立一个三束离子和电子显微镜设施，用于迄今为止对带电粒子束进行高分辨率分析过于敏感的材料的改性、制备和表征。预计材料将被研究人工制品免费和在纳米级的双离子束和新的探测器，允许新的成像模式和极端的化学灵敏度加上受控的气氛转移到其他仪器的相关测量。这种独特的设施应该有利于许多学科的研究，如物理，化学，地质学，制药，材料，土木和化学工程，允许首次观察不同材料中的生命现象。

This project aims to establish a triple beam ion and electron microscope facility for the modification, preparation and characterisation of materials that have hitherto been too sensitive for high resolution analysis with charged particle beams. It is expected that materials will be studied artefact-free and at the nanoscale with twin ion beams and new detectors that allow novel imaging modes and extreme chemical sensitivity plus controlled atmosphere transfer to other instruments for correlative measurements. This unique facility should benefit research in many disciplines such as physics, chemistry, geology, pharmacy, materials, civil and chemical engineering by allowing first-ever observations of vital phenomena in diverse materials.