A triple beam microscope: new frontiers in materials nanocharacterisation

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This project aims to establish a triple beam ion and electron microscope facility for the modification, preparation and characterisation of materials that have hitherto been too sensitive for high resolution analysis with charged particle beams. It is expected that materials will be studied artefact-free and at the nanoscale with twin ion beams and new detectors that allow novel imaging modes and extreme chemical sensitivity plus controlled atmosphere transfer to other instruments for correlative measurements. This unique facility should benefit research in many disciplines such as physics, chemistry, geology, pharmacy, materials, civil and chemical engineering by allowing first-ever observations of vital phenomena in diverse materials.