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Studies of dielectric oxides as a function of field and temperature using scanning transmission electron microscopy

Studies of dielectric oxides as a function of field and temperature using scanning transmission electron microscopy
使用扫描透射电子显微镜研究介电氧化物随场和温度的变化
批准号:
1990429
负责人:
金额:
$0.0万
依托单位:
依托单位国家:
英国
项目类别:
Studentship
财政年份:
2017
资助国家:
英国
项目状态:
已结题
起止时间:
2017 至 --

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中文摘要
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英文摘要
Developing high temperature dielectric materials is important for a range of industrial areas, as this would enable electronic controls to be placed closer to the warm zone of a device such as an engine and therefore improve the operation. This project is therefore of benefit to a range of areas and especially as concerns energy-efficient transportation, and thus touching on key EPSRC and national priorities related to Energy. The specific aim of this project is to develop microscopy techniques for the analysis of the structure and local polarisation of such materials in-situ, under both elevated temperature and electrical bias. It is being performed in parallel to the EPSRC-funded project, EP/P013945/1, "Analysis of Polar Structure in High Temperature Relaxor Dielectrics: Framework for Materials Discovery". Materials are mainly being provided through this project from the group of Dr Steven J Milne at the University of Leeds, where this new class of high temperature dielectrics has been developed. The methods will combine a number of new developments including combined heating and biasing of transmission electron microscope specimens on a MEMS chip via a collaboration with DENS solutions BV, and pixelated detection of scattered and diffracted electrons in scanning transmission electron microscopy using recently developed detectors. This latter area was extensively developed at Glasgow through the project "Fast Pixel Detectors: a paradigm shift in STEM imaging" (EP/M009963/1), and this work also represents a continuation of that work and its application to a specific problem in the applied materials science of functional oxides.
期刊论文(1)
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会议论文
Preparation and testing of MEMS-based samples for in situ heating and biasing in the TEM/STEM
用于 TEM/STEM 中原位加热和偏置的基于 MEMS 的样品的制备和测试
DOI: --
发表时间: 2019
期刊: Microscopy and Analysis
影响因子: --
作者: [Macgregor TA]
通讯作者: Macgregor TA
国内基金
海外基金
均匀纳米孔低介电材料的可控制备研究
  • 批准号:
    90606011
  • 项目类别:
    重大研究计划
  • 资助金额:
    30.0万元
  • 批准年份:
    2006
  • 负责人:
    徐洪耀
  • 依托单位: