Studies of dielectric oxides as a function of field and temperature using scanning transmission electron microscopy

开发高温介质材料对于一系列工业领域非常重要，因为这将使电子控制装置更靠近发动机等设备的温暖区域，从而改善操作。因此，该项目有利于一系列领域，特别是在节能运输方面，从而触及EPSRC和国家与能源相关的重点。该项目的具体目标是开发显微镜技术，用于在高温和电偏压下原位分析这些材料的结构和局部极化。该项目与epsrc资助项目EP/P013945/1“高温弛豫介质的极性结构分析：材料发现的框架”并行进行。材料主要是由利兹大学的Steven J Milne博士小组通过这个项目提供的，这种新型高温电介质是在那里开发出来的。这些方法将结合许多新的发展，包括通过与DENS solutions BV合作，在MEMS芯片上对透射电子显微镜样品进行联合加热和偏置，以及使用最新开发的探测器在扫描透射电子显微镜中对散射和衍射电子进行像素化检测。后一个领域在格拉斯哥通过“快速像素探测器：STEM成像的范式转变”（EP/M009963/1）项目得到了广泛的发展，这项工作也代表了该工作的延续，并将其应用于功能氧化物应用材料科学的特定问题。

Developing high temperature dielectric materials is important for a range of industrial areas, as this would enable electronic controls to be placed closer to the warm zone of a device such as an engine and therefore improve the operation. This project is therefore of benefit to a range of areas and especially as concerns energy-efficient transportation, and thus touching on key EPSRC and national priorities related to Energy. The specific aim of this project is to develop microscopy techniques for the analysis of the structure and local polarisation of such materials in-situ, under both elevated temperature and electrical bias. It is being performed in parallel to the EPSRC-funded project, EP/P013945/1, "Analysis of Polar Structure in High Temperature Relaxor Dielectrics: Framework for Materials Discovery". Materials are mainly being provided through this project from the group of Dr Steven J Milne at the University of Leeds, where this new class of high temperature dielectrics has been developed. The methods will combine a number of new developments including combined heating and biasing of transmission electron microscope specimens on a MEMS chip via a collaboration with DENS solutions BV, and pixelated detection of scattered and diffracted electrons in scanning transmission electron microscopy using recently developed detectors. This latter area was extensively developed at Glasgow through the project "Fast Pixel Detectors: a paradigm shift in STEM imaging" (EP/M009963/1), and this work also represents a continuation of that work and its application to a specific problem in the applied materials science of functional oxides.