FOURIER DOMAIN LOW COHERENCE INTERFEROMETRIC MICROSCOPY

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This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. We have developed a Fourier domain reflectance phase imaging microscope. A common-path phase-referenced detection scheme allows angstrom-scale measurements of cell displacements at kHz bandwidths. Two-dimensional imaging can be performed by scanning the sample or the beam. Using this system, we have obtained high resolution reflection phase images of single cultured HEK293 cells and neurons. Imaging of test objects demonstrates the instruments sub-nanometer stability and sensitivity to cell motions.