PROBE-BASED DUAL-BEAM INTERFEROMETRY

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This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. We are developing a fiber optic probe-based dual-beam interferometer for measuring subnanometer displacements of surfaces without need for a separate reference surface. In the new probe design the reference reflection is provided by a zero-degree cleaved fiber end and the transmitted beam is focused by a gradient-index lens. The fiber probe will have applications in biology and engineering.