FOURIER DOMAIN LOW COHERENCE INTERFEROMETRIC MICROSCOPY

这个子项目是利用由NIH/NCRR资助的中心拨款提供的资源的许多研究子项目之一。子项目和调查员(PI)可能从另一个NIH来源获得了主要资金，因此可能会出现在其他CRISE条目中。列出的机构是针对中心的，而不一定是针对调查员的机构。我们正在开发一种傅立叶域反射位相成像显微镜。公共路径相位基准检测方案允许以埃尺度测量千赫带宽上的单元位移。双折射光学系统可实现高横向和纵向分辨率。可以通过扫描样品或光束来执行二维成像。反射相位测量将被用来测量微小的相移和膜波动，这些已知伴随着神经元和神经纤维的电活动。

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. We are developing a Fourier domain reflectance phase imaging microscope. A common-path phase-referenced detection scheme allows angstrom-scale measurements of cell displacements at kHz bandwidths. Birefringent optics enable high transverse and longitudinal resolution. Two-dimensional imaging can be performed by scanning the sample or the beam. Reflection phase measurements will be used to measure small phase shifts and membrane fluctuations which are known to accompany electrical activity in neurons and nerve fibers.