WIDE-FIELD REFLECTION PHASE MICROSCOPY

宽视场反射相位显微镜

• 批准号: 8364156
• 负责人: ZAHID YAQOOB
• 金额: $ 2.97万
• 依托单位: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
• 依托单位国家: 美国
• 财政年份: 2011
• 资助国家: 美国
• 起止时间: 2011-06-01 至 2012-05-31
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/8364156
• 关键词: Biomedical Research; Frequencies; Funding; Goals; Grant; Interferometry; Lasers; Length; Microscope; Microscopy; Motion; National Center for Research Resources; Optics; Phase; Principal Investigator; Process; Research; Research Infrastructure; Resources; Sampling; Signal Transduction; Source; Surface; Time; United States National Institutes of Health; base; cost; design; digital; nanometer

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. Primary support for the subproject and the subproject's principal investigator may have been provided by other sources, including other NIH sources. The Total Cost listed for the subproject likely represents the estimated amount of Center infrastructure utilized by the subproject, not direct funding provided by the NCRR grant to the subproject or subproject staff. The goal of this project is to design and develop a wide-field reflection phase microscope based on low-coherence time-domain interferometry and off-axis digital holographic microscopy. The unique optical design of the phase microscope allows the reference optical beam to interfere with the signal beam at an angle in such a manner that the path length across the whole field of view is same for both the beams. This leads to single-shot recording of the sample phase modulated by high frequency spatial fringes. Finally, these single-shot interferograms can be processed to determine the phase and hence sub-nanometer motions associated with the surface under study.

该子项目是利用资源的众多研究子项目之一 由 NIH/NCRR 资助的中心拨款提供。子项目的主要支持 并且子项目的主要研究者可能是由其他来源提供的， 包括其他 NIH 来源。 子项目可能列出的总成本 代表子项目使用的中心基础设施的估计数量， NCRR 赠款不直接向子项目或子项目工作人员提供资金。 该项目的目标是设计和开发基于低相干时域干涉测量和离轴数字全息显微镜的宽视场反射相位显微镜。相位显微镜独特的光学设计允许参考光束以一定角度与信号光束干涉，使得两束光束在整个视场上的路径长度相同。这导致单次记录由高频空间条纹调制的样本相位。最后，可以处理这些单次干涉图以确定相位，从而确定与所研究的表面相关的亚纳米运动。