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FOURIER DOMAIN LOW COHERENCE INTERFEROMETRIC MICROSCOPY

FOURIER DOMAIN LOW COHERENCE INTERFEROMETRIC MICROSCOPY
傅里叶域低相干干涉显微镜
批准号:
8364138
负责人:
ZAHID YAQOOB
金额:
$2.97万
依托单位国家:
美国
项目类别:
财政年份:
2011
资助国家:
美国
项目状态:
已结题
起止时间:
2011-06-01 至 2012-05-31

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项目成果

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中文摘要
翻译
这个子项目是利用资源的许多研究子项目之一。 由NIH/NCRR资助的中心拨款提供。对子项目的主要支持 子项目的首席调查员可能是由其他来源提供的, 包括美国国立卫生研究院的其他来源。为子项目列出的总成本可能 表示该子项目使用的中心基础设施的估计数量, 不是由NCRR赠款提供给次级项目或次级项目工作人员的直接资金。 本项目的目标是开发一种具有深度分辨成像能力的低相干反射位相显微镜,用于细胞膜动力学的反射模式研究。经典的光谱域位相显微镜(SDPM)实现采用公共路径配置,其中远离生物样品的玻璃覆盖表面作为参考反射器。然而,公共光路系统通过使用相对较低的NA显微镜物镜来同时从样品和参考表面收集光信号,从而损害了空间分辨率。此外,公共路径系统使用点照明,属于单侧向点测量技术的范畴。为了克服经典SDPM设计的局限性,我们提出了一种线场照明的相敏低相干位相显微镜。线场照明不仅可以为共模噪声抑制提供自相位参考,而且还可以同时进行多个横向位置的深度分辨相位测量。
英文摘要
This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. Primary support for the subproject and the subproject's principal investigator may have been provided by other sources, including other NIH sources. The Total Cost listed for the subproject likely represents the estimated amount of Center infrastructure utilized by the subproject, not direct funding provided by the NCRR grant to the subproject or subproject staff. The goal of this project is to develop a low coherence reflection phase microscope with depth-resolved imaging capability for reflection-mode studies of cell membrane dynamics. Classical spectral domain phase microscope (SDPM) implementations employ common-path configuration in which the glass coverslip surface farther from the biological sample serves as a reference reflector. The common-path systems, however, compromise with the spatial resolution by using relatively low NA microscope objectives to simultaneously collect optical signal from the specimen as well as the reference surface. Moreover, the common-path systems use point illumination and fall into the category of single lateral point measurement techniques. To overcome the limitations of classical SDPM designs, we propose to build a phase-sensitive low coherence phase microscope with line-field illumination. The line-field illumination will not only allow self-phase referencing for common-mode noise rejection but also simultaneous depth-resolved phase measurement of multiple lateral locations.
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WIDE-FIELD REFLECTION PHASE MICROSCOPY
WIDE-FIELD REFLECTION PHASE MICROSCOPY
FOURIER DOMAIN LOW COHERENCE INTERFEROMETRIC MICROSCOPY
FOURIER DOMAIN LOW COHERENCE INTERFEROMETRIC MICROSCOPY
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